Assignee
ANCHOR SEMICONDUCTOR INC
US·7 granted patents·85 citations·filing 2004–2021
Top patents by PatentIndex Score
7 records- 0190US9846934B2Pattern weakness and strength detection and tracking during a semiconductor device fabrication processANCHOR SEMICONDUCTOR INC·Filed 2016·Granted Dec 19, 2017·10 cites·17 claims
- 0289US10546085B2Pattern centric process controlANCHOR SEMICONDUCTOR INC·Filed 2018·Granted Jan 28, 2020·7 cites·39 claims
- 0386US7765515B2Pattern match based optical proximity correction and verification of integrated circuit layoutANCHOR SEMICONDUCTOR INC·Filed 2007·Granted Jul 27, 2010·16 cites·21 claims
- 0485US10997340B2Pattern centric process controlANCHOR SEMICONDUCTOR INC·Filed 2019·Granted May 4, 2021·5 cites·20 claims
- 0585US7275227B1Method of checking optical proximity correction dataANCHOR SEMICONDUCTOR INC·Filed 2004·Granted Sep 25, 2007·46 cites·12 claims
- 0669US10062160B2Pattern weakness and strength detection and tracking during a semiconductor device fabrication processANCHOR SEMICONDUCTOR INC·Filed 2017·Granted Aug 28, 2018·1 cites·30 claims
- 0768US11694009B2Pattern centric process controlANCHOR SEMICONDUCTOR INC·Filed 2021·Granted Jul 4, 2023·0 cites·17 claims
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