Assignee
ANDO TOHRU
JP·3 granted patents·1 pending application·2 citations·filing 2010–2010
Top patents by PatentIndex Score
4 records- 0165US8309922B2Semiconductor inspection method and device that consider the effects of electron beamsANDO TOHRU·Filed 2010·Granted Nov 13, 2012·2 cites·10 claims
- 0248US8067752B2Semiconductor testing method and semiconductor testerANDO TOHRU·Filed 2010·Granted Nov 29, 2011·0 cites·10 claims
- 0343US8178837B2Logical CAD navigation for device characteristics evaluation systemANDO TOHRU·Filed 2010·Granted May 15, 2012·0 cites·8 claims
- 0433US2011291692A1Method and apparatus for inspecting semiconductor using absorbed current imageANDO TOHRU·Filed 2010·Application pending·0 cites
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