Assignee
ANRITSU CORP
JP·518 granted patents·101 pending applications·5,897 citations·filing 1985–2025
Top patents by PatentIndex Score
619 records- 0197US12265120B2Error rate measurement apparatus and error rate measurement methodANRITSU CORP·Filed 2023·Granted Apr 1, 2025·4 cites·6 claims
- 0295US11283481B2Spread spectrum clock generator and spread spectrum clock generation method, pulse pattern generator and pulse pattern generation method, and error rate measuring device and error rate measuring methodANRITSU CORP·Filed 2021·Granted Mar 22, 2022·5 cites·10 claims
- 0395US11251879B1Mobile terminal testing device and mobile terminal testing methodANRITSU CORP·Filed 2021·Granted Feb 15, 2022·5 cites·9 claims
- 0495US9397923B2Mobile communication terminal test device and mobile communication terminal test methodANRITSU CORP·Filed 2014·Granted Jul 19, 2016·64 cites·14 claims
- 0594US6839032B2Protable radio terminal testing apparatus using single self-complementary antennaANRITSU CORP·Filed 2002·Granted Jan 4, 2005·194 cites·15 claims
- 0694US6611322B1Optical time domain reflectometer which measures an optical fiber with different wavelengths according to an order and collectively displays waveform data and a list of events for each waveform in the same screenANRITSU CORP·Filed 2000·Granted Aug 26, 2003·85 cites·14 claims
- 0793US11290195B2Mobile terminal testing device and mobile terminal testing methodANRITSU CORP·Filed 2021·Granted Mar 29, 2022·4 cites·7 claims
- 0893US10958361B2Antenna apparatus and measurement methodANRITSU CORP·Filed 2020·Granted Mar 23, 2021·5 cites·20 claims
- 0991US5340949AMetering system capable of easily effecting high-accuracy metering for various works including sticky materialsANRITSU CORP·Filed 1991·Granted Aug 23, 1994·125 cites·8 claims
- 1090US10483636B1Electromagnetic wave shield boxANRITSU CORP·Filed 2019·Granted Nov 19, 2019·21 cites·20 claims
- 1190US10382076B2Antenna device and measurement methodANRITSU CORP·Filed 2018·Granted Aug 13, 2019·38 cites·20 claims
- 1290US7620078B2Tunable semiconductor laser device, manufacturing method therefor, and gas detector using therewithANRITSU CORP·Filed 2006·Granted Nov 17, 2009·14 cites·28 claims
- 1389US12389243B2Mobile terminal testing device and mobile terminal testing methodANRITSU CORP·Filed 2023·Granted Aug 12, 2025·2 cites·7 claims
- 1489US11489600B2Mobile terminal testing device and mobile terminal testing methodANRITSU CORP·Filed 2021·Granted Nov 1, 2022·2 cites·8 claims
- 1589US11277763B2Mobile terminal measurement system and communication management information display methodANRITSU CORP·Filed 2021·Granted Mar 15, 2022·2 cites·12 claims
- 1689US10439280B1Antenna measurement system and antenna measurement methodANRITSU CORP·Filed 2018·Granted Oct 8, 2019·4 cites·20 claims
- 1789US6597323B2Dielectric leaky wave antenna having mono-layer structureANRITSU CORP·Filed 2001·Granted Jul 22, 2003·66 cites·46 claims
- 1889US6317095B1Planar antenna and method for manufacturing the sameANRITSU CORP·Filed 1999·Granted Nov 13, 2001·110 cites·22 claims
- 1988US11632172B2OTDR measurement apparatus and control methodANRITSU CORP·Filed 2021·Granted Apr 18, 2023·3 cites·5 claims
- 2088US11356187B2Mobile terminal testing device and mobile terminal testing methodANRITSU CORP·Filed 2021·Granted Jun 7, 2022·2 cites·7 claims
- 2188US11293983B2Error rate measuring apparatus and setting screen display methodANRITSU CORP·Filed 2021·Granted Apr 5, 2022·2 cites·4 claims
- 2288US11272385B2Communication terminal measurement apparatus and measurement-related information display methodANRITSU CORP·Filed 2020·Granted Mar 8, 2022·3 cites·10 claims
- 2388US10763979B2Antenna apparatus and measurement methodANRITSU CORP·Filed 2019·Granted Sep 1, 2020·6 cites·20 claims
- 2488US7394415B2Time-interleaved analog-to-digital converter and high speed signal processing system using the sameANRITSU CORP·Filed 2005·Granted Jul 1, 2008·33 cites·21 claims
- 2588US5754571ATunable wavelength light source apparatus for stabilizing power intensity by using external auto-power controlANRITSU CORP·Filed 1995·Granted May 19, 1998·106 cites·33 claims
- 2688US5444724ATunable wavelength light source incorporated optical filter using interferometer into external cavityANRITSU CORP·Filed 1994·Granted Aug 22, 1995·62 cites·41 claims
- 2786US11714130B2Error rate measuring apparatus and error distribution display methodANRITSU CORP·Filed 2021·Granted Aug 1, 2023·1 cites·8 claims
- 2886US9042839B2Mobile communication terminal test system and mobile communication terminal test methodANRITSU CORP·Filed 2013·Granted May 26, 2015·8 cites·10 claims
- 2986US7787543B2Pulse pattern generator and communication device evaluation system utilizing the sameANRITSU CORP·Filed 2005·Granted Aug 31, 2010·15 cites·12 claims
- 3085US11525853B2Temperature test apparatus and temperature test methodANRITSU CORP·Filed 2020·Granted Dec 13, 2022·2 cites·7 claims
- 3185US7812760B2Short-range radar and control method thereofANRITSU CORP·Filed 2007·Granted Oct 12, 2010·14 cites·22 claims
- 3285US7620513B2Optical time domain reflectometer, and optical fiber measuring method and optical fiber measuring system using the sameANRITSU CORP·Filed 2006·Granted Nov 17, 2009·16 cites·25 claims
- 3385US7512430B2Electromagnetic wave shield boxANRITSU CORP·Filed 2006·Granted Mar 31, 2009·22 cites·7 claims
- 3485US6603555B1Gas detecting apparatus using laser absorption spectroscopyANRITSU CORP·Filed 2000·Granted Aug 5, 2003·31 cites·12 claims
- 3585US5767453ACombined metering apparatusANRITSU CORP·Filed 1995·Granted Jun 16, 1998·77 cites·43 claims
- 3685US4927266AOptical signal generating apparatus and optical power meter calibrating system using the sameANRITSU CORP·Filed 1988·Granted May 22, 1990·64 cites·12 claims
- 3785US4900940AOptical system for measuring a surface profile of an object using a converged, inclined light beam and movable converging lensANRITSU CORP·Filed 1988·Granted Feb 13, 1990·45 cites·9 claims
- 3885US4839582ASignal analyzer apparatus with automatic frequency measuring functionANRITSU CORP·Filed 1988·Granted Jun 13, 1989·68 cites·17 claims
- 3984US11977464B2Error rate measuring apparatus and error rate measuring methodANRITSU CORP·Filed 2022·Granted May 7, 2024·3 cites·8 claims
- 4084US11921140B2Test apparatus and test methodANRITSU CORP·Filed 2022·Granted Mar 5, 2024·1 cites·12 claims
- 4184US11754609B2Temperature test apparatus and temperature test methodANRITSU CORP·Filed 2021·Granted Sep 12, 2023·2 cites·8 claims
- 4284US11171395B2Transmission line and air bridge structureANRITSU CORP·Filed 2020·Granted Nov 9, 2021·3 cites·15 claims
- 4384US7623073B2Linearly polarized antenna and radar apparatus using the sameANRITSU CORP·Filed 2005·Granted Nov 24, 2009·19 cites·24 claims
- 4484US7483470B2Semiconductor laser capable of coupling with single mode optical fiber at high coupling efficiencyANRITSU CORP·Filed 2005·Granted Jan 27, 2009·10 cites·17 claims
- 4584US6445445B1Evaluation apparatus for an optical fiber transmission lineANRITSU CORP·Filed 2000·Granted Sep 3, 2002·32 cites·14 claims
- 4683US9098605B2Test system, test method, and test deviceANRITSU CORP·Filed 2013·Granted Aug 4, 2015·8 cites·13 claims
- 4783US7643708B2Optical modulatorANRITSU CORP·Filed 2006·Granted Jan 5, 2010·10 cites·6 claims
- 4883US6081539ATunable laser source apparatus having wideband oscillation wavelength continuous sweep functionANRITSU CORP·Filed 1999·Granted Jun 27, 2000·66 cites·15 claims
- 4983US5359154AConveyor apparatus having plural conveyors with equalized conveying speeds controlled by an inverter meansANRITSU CORP·Filed 1990·Granted Oct 25, 1994·56 cites·7 claims
- 5083US5210712AWaveform shaping circuit and digital signal analyzing apparatus using the sameANRITSU CORP·Filed 1991·Granted May 11, 1993·44 cites·21 claims
Showing the top 50 of 619 patent records by PatentIndex Score.
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