Assignee
APPLIED MATERIALS SEA PTE LTD
SG·8 granted patents·74 citations·filing 2006–2008
Top patents by PatentIndex Score
8 records- 0191US7961763B2System for detection of wafer defectsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Jun 14, 2011·14 cites·6 claims
- 0289US7843558B2Optical inspection tools featuring light shaping diffusersAPPLIED MATERIALS SEA PTE LTD·Filed 2008·Granted Nov 30, 2010·14 cites·14 claims
- 0385US7843559B2System for detection of wafer defectsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Nov 30, 2010·7 cites·16 claims
- 0484US7916286B2Defect detection through image comparison using relative measuresAPPLIED MATERIALS SEA PTE LTD·Filed 2007·Granted Mar 29, 2011·12 cites·20 claims
- 0581US7973921B2Dynamic illumination in optical inspection systemsAPPLIED MATERIALS SEA PTE LTD·Filed 2008·Granted Jul 5, 2011·10 cites·20 claims
- 0676US7869643B2Advanced cell-to-cell inspectionAPPLIED MATERIALS SEA PTE LTD·Filed 2007·Granted Jan 11, 2011·10 cites·19 claims
- 0770US7924420B2Optical inspection including partial scanning of wafersAPPLIED MATERIALS SEA PTE LTD·Filed 2007·Granted Apr 12, 2011·5 cites·21 claims
- 0868US8031931B2Printed fourier filtering in optical inspection toolsAPPLIED MATERIALS SEA PTE LTD·Filed 2006·Granted Oct 4, 2011·2 cites·21 claims
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