Assignee
APPLIED RES AND PHOTONICS INC
US·4 granted patents·50 citations·filing 2004–2015
Top patents by PatentIndex Score
4 records- 0190US9909986B2Thickness determination and layer characterization using terahertz scanning reflectometryAPPLIED RES AND PHOTONICS INC·Filed 2015·Granted Mar 6, 2018·7 cites·8 claims
- 0287US7389029B2Photonic waveguide structures for chip-scale photonic integrated circuitsAPPLIED RES AND PHOTONICS INC·Filed 2004·Granted Jun 17, 2008·41 cites·39 claims
- 0359US9239290B2Terahertz scanning reflectometerAPPLIED RES AND PHOTONICS INC·Filed 2013·Granted Jan 19, 2016·0 cites·6 claims
- 0455US7412121B2Nanophotonic integrated circuit and fabrication thereofAPPLIED RES AND PHOTONICS INC·Filed 2006·Granted Aug 12, 2008·2 cites·23 claims
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