Assignee
AUBEL OLIVER
DE·4 granted patents·2 pending applications·6 citations·filing 2006–2011
Top patents by PatentIndex Score
6 records- 0169US8268679B2Semiconductor device comprising eFUSES of enhanced programming efficiencyAUBEL OLIVER·Filed 2009·Granted Sep 18, 2012·5 cites·13 claims
- 0249US8153524B2Providing superior electromigration performance and reducing deterioration of sensitive low-k dielectrics in metallization systems of semiconductor devicesAUBEL OLIVER·Filed 2010·Granted Apr 10, 2012·1 cites·20 claims
- 0348US8314625B2Built-in compliance in test structures for leakage and dielectric breakdown of dielectric materials of metallization systems of semiconductor devicesAUBEL OLIVER·Filed 2009·Granted Nov 20, 2012·0 cites·19 claims
- 0441US8643183B2Long-term heat-treated integrated circuit arrangements and methods for producing the sameAUBEL OLIVER·Filed 2006·Granted Feb 4, 2014·0 cites·17 claims
- 0533US2012153479A1Performance Enhancement in Metallization Systems of Microstructure Devices by Incorporating an Intermediate Barrier LayerAUBEL OLIVER·Filed 2011·Application pending·0 cites
- 0629US2011049727A1Recessed interlayer dielectric in a metallization structure of a semiconductor deviceAUBEL OLIVER·Filed 2010·Application pending·0 cites
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