Assignee
BADGER KAREN D
US·2 granted patents·2 pending applications·1 citations·filing 2006–2010
Top patents by PatentIndex Score
4 records- 0152US8437967B2Method and system for inspecting multi-layer reticlesBADGER KAREN D·Filed 2010·Granted May 7, 2013·1 cites·25 claims
- 0248US2008279443A1Mask inspection process accounting for mask writer proximity correctionBADGER KAREN D·Filed 2008·Application pending·0 cites
- 0347US8538129B2Mask program defect testBADGER KAREN D·Filed 2009·Granted Sep 17, 2013·0 cites·12 claims
- 0434US2007174012A1Method Of Determining Photomask Inspection CapabilitiesBADGER KAREN D·Filed 2006·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →