Assignee
BAILEY TODD C
US·3 granted patents·8 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0172US8495527B2Pattern recognition with edge correction for design based metrologyBAILEY TODD C·Filed 2011·Granted Jul 23, 2013·4 cites·20 claims
- 0265US8514374B2Alignment method for semiconductor processingBAILEY TODD C·Filed 2009·Granted Aug 20, 2013·2 cites·4 claims
- 0364US8429570B2Pattern recognition with edge correction for design based metrologyBAILEY TODD C·Filed 2010·Granted Apr 23, 2013·2 cites·25 claims
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