Assignee
BARABI NASSER
US·5 granted patents·1 pending application·40 citations·filing 2006–2012
Top patents by PatentIndex Score
6 records- 0194US8508245B1Thermal control unit used to maintain the temperature of IC devices under testBARABI NASSER·Filed 2010·Granted Aug 13, 2013·21 cites·11 claims
- 0284US8493085B2Spring contact pin for an ic test socket and the likeBARABI NASSER·Filed 2010·Granted Jul 23, 2013·6 cites·11 claims
- 0376US9766268B2Contactor with angled spring probesBARABI NASSER·Filed 2007·Granted Sep 19, 2017·8 cites·22 claims
- 0475US8653842B2Systems and methods for thermal control of integrated circuits during testingBARABI NASSER·Filed 2011·Granted Feb 18, 2014·2 cites·9 claims
- 0570US8981802B2Systems and methods for conforming device testers to integrated circuit device profilesBARABI NASSER·Filed 2012·Granted Mar 17, 2015·3 cites·11 claims
- 0637US2007018666A1Spring contact pin for an IC chip testerBARABI NASSER·Filed 2006·Application pending·0 cites
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