Assignee
BEIJING TSD SEMICONDUCTOR CO LTD
CN·2 granted patents·3 pending applications·0 citations·filing 2025–2025
Top patents by PatentIndex Score
5 records- 0142US12397394B1Method and device for determining parameters of near-surface dielectric layer in wafer grinding sceneBEIJING TSD SEMICONDUCTOR CO LTD·Filed 2025·Granted Aug 26, 2025·0 cites·11 claims
- 0241US2025243370A1Polydimethylsiloxane superamphiphobic coating, preparation method thereof, and application thereofBEIJING TSD SEMICONDUCTOR CO LTD·Filed 2025·Application pending·0 cites
- 0341US2025187136A1Endpoint detection method and device for wafer film grindingBEIJING TSD SEMICONDUCTOR CO LTD·Filed 2025·Application pending·0 cites
- 0438US2025369748A1Method for measuring film thickness in situ, reference spectrum generation method, and devicesBEIJING TSD SEMICONDUCTOR CO LTD·Filed 2025·Application pending·0 cites
- 0532US12416490B1Method and chemical mechanical planarization device for in-situ measurement of film thicknessBEIJING TSD SEMICONDUCTOR CO LTD·Filed 2025·Granted Sep 16, 2025·0 cites·12 claims
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