Assignee
BHUSHAN MANJUL
US·6 granted patents·1 pending application·12 citations·filing 2009–2012
Technology mixG01R7
Top patents by PatentIndex Score
7 records- 0175US8456169B2High speed measurement of random variation/yield in integrated circuit device testingBHUSHAN MANJUL·Filed 2010·Granted Jun 4, 2013·3 cites·20 claims
- 0264US8248094B2Acquisition of silicon-on-insulator switching history effects statisticsBHUSHAN MANJUL·Filed 2009·Granted Aug 21, 2012·4 cites·20 claims
- 0363US8179120B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2009·Granted May 15, 2012·3 cites·16 claims
- 0455US8310269B2Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditionsBHUSHAN MANJUL·Filed 2009·Granted Nov 13, 2012·2 cites·22 claims
- 0550US9194909B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2012·Granted Nov 24, 2015·0 cites·11 claims
- 0650US9075109B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2012·Granted Jul 7, 2015·0 cites·11 claims
- 0739US2012256651A1Test structure for parallel test implemented with one metal layerBHUSHAN MANJUL·Filed 2011·Application pending·0 cites
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