Assignee
BROCHU JR DAVID G
US·2 granted patents·1 pending application·9 citations·filing 2011–2011
Top patents by PatentIndex Score
3 records- 0178US8587383B2Measuring bias temperature instability induced ring oscillator frequency degradationBROCHU JR DAVID G·Filed 2011·Granted Nov 19, 2013·6 cites·20 claims
- 0269US8754655B2Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migrationBROCHU JR DAVID G·Filed 2011·Granted Jun 17, 2014·3 cites·25 claims
- 0333US2012187974A1Dual Stage Voltage Ramp Stress Test for Gate DielectricsBROCHU JR DAVID G·Filed 2011·Application pending·0 cites
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