Assignee
BRUGUIER ANTOINE JEAN
US·2 granted patents·53 citations·filing 2011–2012
Top patents by PatentIndex Score
2 records- 0194US9588439B1Information matrix creation and calibration test pattern selection based on computational lithography model parametersBRUGUIER ANTOINE JEAN·Filed 2011·Granted Mar 7, 2017·38 cites·24 claims
- 0293US8887105B1Calibration pattern selection based on noise sensitivityBRUGUIER ANTOINE JEAN·Filed 2012·Granted Nov 11, 2014·15 cites·20 claims
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