Assignee
BRUKER JV ISRAEL LTD
IL·9 granted patents·71 citations·filing 2017–2019
Top patents by PatentIndex Score
9 records- 0197US10976270B2X-ray detection optics for small-angle X-ray scatterometryBRUKER JV ISRAEL LTD·Filed 2019·Granted Apr 13, 2021·23 cites·18 claims
- 0290US10816487B2Image contrast in X-ray topography imaging for defect inspectionBRUKER JV ISRAEL LTD·Filed 2019·Granted Oct 27, 2020·13 cites·18 claims
- 0389US10634628B2X-ray fluorescence apparatus for contamination monitoringBRUKER JV ISRAEL LTD·Filed 2018·Granted Apr 28, 2020·24 cites·32 claims
- 0487US10976268B2X-ray source optics for small-angle X-ray scatterometryBRUKER JV ISRAEL LTD·Filed 2019·Granted Apr 13, 2021·2 cites·27 claims
- 0585US10386313B2Closed-loop control of X-ray knife edgeBRUKER JV ISRAEL LTD·Filed 2017·Granted Aug 20, 2019·3 cites·16 claims
- 0680US9852875B2X-ray tubeBRUKER JV ISRAEL LTD·Filed 2017·Granted Dec 26, 2017·2 cites·6 claims
- 0778US10684238B2Method and apparatus for X-ray scatterometryBRUKER JV ISRAEL LTD·Filed 2017·Granted Jun 16, 2020·3 cites·5 claims
- 0877US10976269B2Wafer alignment for small-angle x-ray scatterometryBRUKER JV ISRAEL LTD·Filed 2019·Granted Apr 13, 2021·1 cites·16 claims
- 0955US11169099B2Method and apparatus for X-ray scatterometryBRUKER JV ISRAEL LTD·Filed 2019·Granted Nov 9, 2021·0 cites·19 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →