Assignee
BRUKER NANO GMBH
DE·20 granted patents·3 pending applications·13 citations·filing 2013–2024
Top patents by PatentIndex Score
23 records- 0189US11270867B2Method for improving transmission Kikuchi diffraction patternBRUKER NANO GMBH·Filed 2020·Granted Mar 8, 2022·3 cites·14 claims
- 0278US10126256B2Method and arrangement for identifying crystalline phases, a corresponding computer program, and a corresponding computer-readable storage mediumBRUKER NANO GMBH·Filed 2015·Granted Nov 13, 2018·2 cites·6 claims
- 0378US9279779B2Method for identifying a crystallographic candidate phase of a crystalBRUKER NANO GMBH·Filed 2015·Granted Mar 8, 2016·2 cites·7 claims
- 0472US10234282B2Method and system for determining the position of a radiation sourceBRUKER NANO GMBH·Filed 2017·Granted Mar 19, 2019·2 cites·16 claims
- 0570US11156632B2Measuring device for a scanning probe microscope and method for scanning probe microscopy of a measurement sample by means of a scanning probe microscopeBRUKER NANO GMBH·Filed 2020·Granted Oct 26, 2021·1 cites·13 claims
- 0665US10908103B2X-ray fluorescence spectrometerBRUKER NANO GMBH·Filed 2018·Granted Feb 2, 2021·1 cites·10 claims
- 0764US12596082B2Proximity sensor for electron backscatter diffraction systemsBRUKER NANO GMBH·Filed 2023·Granted Apr 7, 2026·0 cites·10 claims
- 0864US9971121B2Device for spatially orienting an X-ray optical unit and apparatus having such a deviceBRUKER NANO GMBH·Filed 2014·Granted May 15, 2018·1 cites·16 claims
- 0964US2025172513A1Handheld X-ray fluorescence, XRF, analyzer and a method for elemental analysis with a handheld XRF analyzerBRUKER NANO GMBH·Filed 2024·Application pending·0 cites
- 1058US12073535B2Method of processing an EDX/XRF map and a corresponding image processing deviceBRUKER NANO GMBH·Filed 2021·Granted Aug 27, 2024·0 cites·15 claims
- 1156US9797848B2Multi-module photon detector and use thereofBRUKER NANO GMBH·Filed 2013·Granted Oct 24, 2017·1 cites·13 claims
- 1252US11940396B2Method for improving an EBSD/TKD mapBRUKER NANO GMBH·Filed 2020·Granted Mar 26, 2024·0 cites·14 claims
- 1350US11300530B2Kikuchi diffraction detectorBRUKER NANO GMBH·Filed 2020·Granted Apr 12, 2022·0 cites·14 claims
- 1447US10197514B2Multi-module photon detector and use thereofBRUKER NANO GMBH·Filed 2017·Granted Feb 5, 2019·0 cites·12 claims
- 1543US12468052B2Hybrid integrated silicon drift detector and method for fabrication thereofBRUKER NANO GMBH·Filed 2022·Granted Nov 11, 2025·0 cites·13 claims
- 1642US2023358695A1Method for determining an element concentration of an eds/wds spectrum of an unknown sample and a corresponding deviceBRUKER NANO GMBH·Filed 2023·Application pending·0 cites
- 1740US11579100B2Method for determining a material compositionBRUKER NANO GMBH·Filed 2020·Granted Feb 14, 2023·0 cites·14 claims
- 1840US10539591B2Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscopeBRUKER NANO GMBH·Filed 2018·Granted Jan 21, 2020·0 cites·13 claims
- 1938US11665441B2Detector, methods for operating a detector and detector pixel circuitBRUKER NANO GMBH·Filed 2019·Granted May 30, 2023·0 cites·10 claims
- 2038US11087953B2Moveable detectorBRUKER NANO GMBH·Filed 2019·Granted Aug 10, 2021·0 cites·12 claims
- 2134US2022244287A1Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for OperatingBRUKER NANO GMBH·Filed 2020·Application pending·0 cites
- 2227US11656244B2Compensating control signal for raster scan of a scanning probe microscopeBRUKER NANO GMBH·Filed 2020·Granted May 23, 2023·0 cites·15 claims
- 2326US12106867B2Method for scanning a sample by means of X-ray optics and an apparatus for scanning a sampleBRUKER NANO GMBH·Filed 2015·Granted Oct 1, 2024·0 cites·11 claims
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