Assignee
BRUKER NANO INC
US·101 granted patents·21 pending applications·267 citations·filing 2006–2025
Top patents by PatentIndex Score
122 records- 0199US10228388B2Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopyBRUKER NANO INC·Filed 2016·Granted Mar 12, 2019·24 cites·17 claims
- 0297US10473693B2Method and apparatus for infrared scanning near-field optical microscopy based on photothermal effectBRUKER NANO INC·Filed 2018·Granted Nov 12, 2019·15 cites·20 claims
- 0397US9588136B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2016·Granted Mar 7, 2017·8 cites·15 claims
- 0496US11688067B2Methods and systems for detecting defects in devices using X-raysBRUKER NANO INC·Filed 2020·Granted Jun 27, 2023·5 cites·17 claims
- 0596US11635449B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2022·Granted Apr 25, 2023·6 cites·20 claims
- 0696US10228389B2Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppressionBRUKER NANO INC·Filed 2015·Granted Mar 12, 2019·15 cites·24 claims
- 0795US11307220B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2021·Granted Apr 19, 2022·6 cites·22 claims
- 0895US11029330B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2019·Granted Jun 8, 2021·8 cites·20 claims
- 0995US10241131B2Method and apparatus for chemical and optical imaging with a broadband sourceBRUKER NANO INC·Filed 2016·Granted Mar 26, 2019·15 cites·25 claims
- 1095US9322842B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2014·Granted Apr 26, 2016·10 cites·19 claims
- 1195US9207167B2Peak force photothermal-based detection of IR nanoabsorptionBRUKER NANO INC·Filed 2015·Granted Dec 8, 2015·6 cites·11 claims
- 1294US11430118B2Methods and systems for process control based on X-ray inspectionBRUKER NANO INC·Filed 2020·Granted Aug 30, 2022·3 cites·20 claims
- 1394US8955161B2Peakforce photothermal-based detection of IR nanoabsorptionBRUKER NANO INC·Filed 2014·Granted Feb 10, 2015·10 cites·20 claims
- 1493US11940461B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2023·Granted Mar 26, 2024·2 cites·20 claims
- 1593US11651492B2Methods and systems for manufacturing printed circuit board based on x-ray inspectionBRUKER NANO INC·Filed 2020·Granted May 16, 2023·3 cites·78 claims
- 1693US11615533B2Methods and systems for product failure prediction based on X-ray image re-examinationBRUKER NANO INC·Filed 2020·Granted Mar 28, 2023·3 cites·35 claims
- 1792US9291640B2Method and apparatus of using peak force tapping mode to measure physical properties of a sampleBRUKER NANO INC·Filed 2014·Granted Mar 22, 2016·9 cites·10 claims
- 1891US11391664B2Debris removal from high aspect structuresBRUKER NANO INC·Filed 2019·Granted Jul 19, 2022·3 cites·8 claims
- 1991US9910064B2Force measurement with real-time baseline determinationBRUKER NANO INC·Filed 2017·Granted Mar 6, 2018·3 cites·11 claims
- 2091US9719916B2PeakForce photothermal-based detection of IR nanoabsorptionBRUKER NANO INC·Filed 2016·Granted Aug 1, 2017·3 cites·19 claims
- 2191US9213047B2Method and apparatus of electrical property measurement using an AFM operating in peak force tapping modeBRUKER NANO INC·Filed 2013·Granted Dec 15, 2015·7 cites·17 claims
- 2290US8881311B2Method and apparatus of physical property measurement using a probe-based nano-localized light sourceBRUKER NANO INC·Filed 2014·Granted Nov 4, 2014·10 cites·20 claims
- 2389US11237087B2Testing assembly including a multiple degree of freedom stageBRUKER NANO INC·Filed 2020·Granted Feb 1, 2022·2 cites·32 claims
- 2489US10802045B2Large radius probeBRUKER NANO INC·Filed 2018·Granted Oct 13, 2020·2 cites·20 claims
- 2589US10197595B2Dual-probe scanning probe microscopeBRUKER NANO INC·Filed 2016·Granted Feb 5, 2019·5 cites·6 claims
- 2688US2024269717A1Debris removal from high aspect structuresBRUKER NANO INC·Filed 2024·Application pending·0 cites
- 2787US2025123192A1Testing assembly including a multiple degree of freedom stageBRUKER NANO INC·Filed 2024·Application pending·0 cites
- 2886US11313777B2Reduction of error in testing friction and wear with the use of high-speed reciprocating motionBRUKER NANO INC·Filed 2020·Granted Apr 26, 2022·3 cites·13 claims
- 2986US11040379B2Debris removal in high aspect structuresBRUKER NANO INC·Filed 2019·Granted Jun 22, 2021·1 cites·13 claims
- 3086US10845382B2Infrared characterization of a sample using oscillating modeBRUKER NANO INC·Filed 2017·Granted Nov 24, 2020·3 cites·16 claims
- 3186US10502761B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2017·Granted Dec 10, 2019·1 cites·7 claims
- 3286US10197596B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2017·Granted Feb 5, 2019·1 cites·12 claims
- 3386US9575090B2Force measurement with real-time baseline determinationBRUKER NANO INC·Filed 2014·Granted Feb 21, 2017·5 cites·9 claims
- 3486US8997259B2Method and apparatus of tuning a scanning probe microscopeBRUKER NANO INC·Filed 2012·Granted Mar 31, 2015·5 cites·20 claims
- 3586US8375594B1Pneumatic counterbalance for optical head gantryBRUKER NANO INC·Filed 2010·Granted Feb 19, 2013·9 cites·23 claims
- 3685US10663380B2Testing assembly including a multiple degree of freedom stageBRUKER NANO INC·Filed 2016·Granted May 26, 2020·3 cites·37 claims
- 3785US10520426B2Peakforce photothermal-based detection of IR nanoabsorptionBRUKER NANO INC·Filed 2017·Granted Dec 31, 2019·1 cites·12 claims
- 3884US12420374B2Chemical-mechanical polishing system with a potentiostat and pulsed-force applied to a workpieceBRUKER NANO INC·Filed 2024·Granted Sep 23, 2025·0 cites·19 claims
- 3984US11964310B2Debris removal from high aspect structuresBRUKER NANO INC·Filed 2023·Granted Apr 23, 2024·0 cites·15 claims
- 4084US2026001188A1Chemical-mechanical polishing system with a potentiostat and pulsed-force applied to a workpieceBRUKER NANO INC·Filed 2025·Application pending·0 cites
- 4183US11448664B2Large radius probeBRUKER NANO INC·Filed 2020·Granted Sep 20, 2022·1 cites·14 claims
- 4283US11215637B2Method and apparatus of atomic force microscope based infrared spectroscopy with controlled probing depthBRUKER NANO INC·Filed 2020·Granted Jan 4, 2022·1 cites·26 claims
- 4383US10914755B2Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopyBRUKER NANO INC·Filed 2019·Granted Feb 9, 2021·1 cites·16 claims
- 4483US9810713B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2016·Granted Nov 7, 2017·1 cites·16 claims
- 4582US12241911B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2024·Granted Mar 4, 2025·0 cites·20 claims
- 4681US9869694B2Method and apparatus of electrical property measurement using an AFM operating in peak force tapping modeBRUKER NANO INC·Filed 2015·Granted Jan 16, 2018·1 cites·16 claims
- 4779US11796565B2AFM imaging with metrology-preserving real time denoisingBRUKER NANO INC·Filed 2021·Granted Oct 24, 2023·1 cites·15 claims
- 4879US11002757B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2019·Granted May 11, 2021·0 cites·14 claims
- 4979US10352860B2Super resolution microscopyBRUKER NANO INC·Filed 2015·Granted Jul 16, 2019·6 cites·16 claims
- 5079US10161960B1Filed-mapping and focal-spot tracking for s-SNOMBRUKER NANO INC·Filed 2018·Granted Dec 25, 2018·1 cites·18 claims
Showing the top 50 of 122 patent records by PatentIndex Score.
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