Assignee
BRYANT CONSULTANTS INC
US·10 granted patents·181 citations·filing 2003–2018
Top patents by PatentIndex Score
10 records- 0191US7003400B2Apparatus and method for displaying subsurface anomalies and surface featuresBRYANT CONSULTANTS INC·Filed 2003·Granted Feb 21, 2006·74 cites·65 claims
- 0287US7386402B2Remotely reconfigurable system for mapping structure subsurface geological anomaliesBRYANT CONSULTANTS INC·Filed 2006·Granted Jun 10, 2008·25 cites·14 claims
- 0385US8019547B2Remotely reconfigurable system for mapping subsurface geological anomaliesBRYANT CONSULTANTS INC·Filed 2008·Granted Sep 13, 2011·21 cites·30 claims
- 0484US7788049B2Remotely reconfigurable system for mapping subsurface geological anomaliesBRYANT CONSULTANTS INC·Filed 2007·Granted Aug 31, 2010·26 cites·36 claims
- 0582US7813883B2Remotely reconfigurable system for mapping subsurface geological anomaliesBRYANT CONSULTANTS INC·Filed 2007·Granted Oct 12, 2010·17 cites·53 claims
- 0679US7693724B2Multidiscipline site development and risk assessment processBRYANT CONSULTANTS INC·Filed 2003·Granted Apr 6, 2010·16 cites·2 claims
- 0776US9324050B2System and method of performing an engineering-based site development and risk assessment processBRYANT CONSULTANTS INC·Filed 2013·Granted Apr 26, 2016·1 cites·23 claims
- 0871US10004184B2Apparatus and method for three-dimensional moisture control using sprinklersBRYANT CONSULTANTS INC·Filed 2015·Granted Jun 26, 2018·1 cites·4 claims
- 0964US10356991B2Method for three-dimensional moisture control using resistivity dataBRYANT CONSULTANTS INC·Filed 2018·Granted Jul 23, 2019·0 cites·13 claims
- 1049US8370167B2System and method of performing an engineering-based site development and risk assessment processBRYANT CONSULTANTS INC·Filed 2010·Granted Feb 5, 2013·0 cites·9 claims
Join the waitlist — get patent alerts
Get an alert when BRYANT CONSULTANTS INC files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →