Assignee
CAI MING
US·16 granted patents·4 pending applications·136 citations·filing 2009–2012
Top patents by PatentIndex Score
20 records- 0196US8513131B2Fin field effect transistor with variable channel thickness for threshold voltage tuningCAI MING·Filed 2011·Granted Aug 20, 2013·39 cites·14 claims
- 0295US8697523B2Integration of SMT in replacement gate FINFET process flowCAI MING·Filed 2012·Granted Apr 15, 2014·25 cites·18 claims
- 0394US8648438B2Structure and method to form passive devices in ETSOI process flowCAI MING·Filed 2011·Granted Feb 11, 2014·19 cites·19 claims
- 0488US8658505B2Embedded stressors for multigate transistor devicesCAI MING·Filed 2011·Granted Feb 25, 2014·9 cites·9 claims
- 0588US8530315B2finFET with fully silicided gateCAI MING·Filed 2012·Granted Sep 10, 2013·9 cites·9 claims
- 0687US8470678B2Tensile stress enhancement of nitride film for stressed channel field effect transistor fabricationCAI MING·Filed 2011·Granted Jun 25, 2013·8 cites·20 claims
- 0779US8421132B2Post-planarization UV curing of stress inducing layers in replacement gate transistor fabricationCAI MING·Filed 2011·Granted Apr 16, 2013·4 cites·25 claims
- 0877US8765491B2Shallow trench isolation recess repair using spacer formation processCAI MING·Filed 2010·Granted Jul 1, 2014·6 cites·13 claims
- 0975US8659091B2Embedded stressors for multigate transistor devicesCAI MING·Filed 2012·Granted Feb 25, 2014·3 cites·14 claims
- 1073US8492218B1Removal of an overlap of dual stress linersCAI MING·Filed 2012·Granted Jul 23, 2013·4 cites·20 claims
- 1166US9507485B2Electronic device, displaying method and file saving methodCAI MING·Filed 2011·Granted Nov 29, 2016·2 cites·5 claims
- 1266US8485758B2Yieldable cone bolt and method of manufacturing sameCAI MING·Filed 2009·Granted Jul 16, 2013·6 cites·28 claims
- 1362US8643120B2FinFET with fully silicided gateCAI MING·Filed 2012·Granted Feb 4, 2014·1 cites·15 claims
- 1461US8577192B2Tunable optical filters with multiple portsCAI MING·Filed 2010·Granted Nov 5, 2013·1 cites·12 claims
- 1551US8633077B2Transistors with uniaxial stress channelsCAI MING·Filed 2012·Granted Jan 21, 2014·0 cites·18 claims
- 1649US8927364B2Structure and method of high-performance extremely thin silicon on insulator complementary metal—oxide—semiconductor transistors with dual stress buried insulatorsCAI MING·Filed 2012·Granted Jan 6, 2015·0 cites·3 claims
- 1740US2013101254A1Optical performance monitoring systemCAI MING·Filed 2011·Application pending·0 cites
- 1838US2012292670A1Post-Silicide Process and Structure For Stressed Liner IntegrationCAI MING·Filed 2011·Application pending·0 cites
- 1937US2013175632A1Reduction of contact resistance and junction leakageCAI MING·Filed 2012·Application pending·0 cites
- 2034US2012028430A1Method and structure to improve formation of silicideCAI MING·Filed 2010·Application pending·0 cites
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