Assignee
CAMECA
US·15 granted patents·1 pending application·262 citations·filing 1975–2023
Top patents by PatentIndex Score
16 records- 0186US4564758AProcess and device for the ionic analysis of an insulating sampleCAMECA·Filed 1984·Granted Jan 14, 1986·40 cites·5 claims
- 0280US4440475AElectron probe microanalyzer comprising an observation system having double magnificationCAMECA·Filed 1982·Granted Apr 3, 1984·61 cites·6 claims
- 0374US3975675AImpulse response magnetic resonance spectrometerCAMECA·Filed 1975·Granted Aug 17, 1976·31 cites·7 claims
- 0470US4748325AMethod and device to discharge samples of insulating material during ion analysisCAMECA·Filed 1987·Granted May 31, 1988·17 cites·7 claims
- 0566US4983831ATime-of-flight analysis method with continuous scanning and analyzer to implement this methodCAMECA·Filed 1988·Granted Jan 8, 1991·18 cites·10 claims
- 0665US4508967AElectronic optical apparatus comprising pyrolytic graphite elementsCAMECA·Filed 1983·Granted Apr 2, 1985·14 cites·6 claims
- 0757US4779046AElectron beam integrated circuit testerCAMECA·Filed 1986·Granted Oct 18, 1988·23 cites·6 claims
- 0852US4171482AMass spectrometer for ultra-rapid scanningCAMECA·Filed 1977·Granted Oct 16, 1979·10 cites·4 claims
- 0947US5189304AHigh transmission mass spectrometer with improved optical couplingCAMECA·Filed 1991·Granted Feb 23, 1993·10 cites·13 claims
- 1047US4912325AMethod for sample analysis by sputtering with a particle beam, and device to implement said methodCAMECA·Filed 1988·Granted Mar 27, 1990·9 cites·5 claims
- 1145US2025323006A1Electron beam device for surface treatmentCAMECA·Filed 2023·Application pending·0 cites
- 1244US7049588B2Device for measuring the emission of X-rays produced by an object exposed to an electron beamCAMECA·Filed 2003·Granted May 23, 2006·2 cites·20 claims
- 1341US6259530B1Method and device for measuring the depths of bottoms of craters in a physico-chemical analyzerCAMECA·Filed 1999·Granted Jul 10, 2001·15 cites·12 claims
- 1441US4036777AIon current measuring arrangementCAMECA·Filed 1976·Granted Jul 19, 1977·5 cites·3 claims
- 1537US8373121B2Magnetic achromatic mass spectrometer with double focusingCAMECA·Filed 2010·Granted Feb 12, 2013·0 cites·5 claims
- 1633US5038045AComposite electromagnetic lens with variable focal distanceCAMECA·Filed 1990·Granted Aug 6, 1991·7 cites·3 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →