Assignee
CAMTEK LTD
IL·36 granted patents·26 pending applications·67 citations·filing 2003–2025
Top patents by PatentIndex Score
62 records- 0191US11828713B1Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2022·Granted Nov 28, 2023·4 cites·15 claims
- 0289US12020417B2Method and system for classifying defects in wafer using wafer-defect images, based on deep learningCAMTEK LTD·Filed 2020·Granted Jun 25, 2024·3 cites·19 claims
- 0388US11927545B1Semiconductor edge and bevel inspection tool systemCAMTEK LTD·Filed 2023·Granted Mar 12, 2024·3 cites·25 claims
- 0481US11047807B2Defect detectionCAMTEK LTD·Filed 2020·Granted Jun 29, 2021·2 cites·23 claims
- 0581US10222517B2Aperture stopCAMTEK LTD·Filed 2017·Granted Mar 5, 2019·4 cites·39 claims
- 0678US6934019B2Confocal wafer-inspection systemCAMTEK LTD·Filed 2004·Granted Aug 23, 2005·29 cites·9 claims
- 0778US2026043647A1Method and system for measuring bump height differencesCAMTEK LTD·Filed 2025·Application pending·0 cites
- 0876US9756313B2High throughput and low cost height triangulation system and methodCAMTEK LTD·Filed 2014·Granted Sep 5, 2017·4 cites·32 claims
- 0976US2025290869A1Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2025·Application pending·0 cites
- 1074US12320757B2Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2023·Granted Jun 3, 2025·0 cites·31 claims
- 1173US10497092B2Continuous light inspectionCAMTEK LTD·Filed 2016·Granted Dec 3, 2019·2 cites·22 claims
- 1271US9989480B2Inspection system having an expanded angular coverageCAMTEK LTD·Filed 2016·Granted Jun 5, 2018·3 cites·20 claims
- 1368US7922932B2Reactive fine particlesCAMTEK LTD·Filed 2009·Granted Apr 12, 2011·0 cites·6 claims
- 1468US2024289945A1Method and system for classifying defects in wafer using wafer-defect images, based on deep learningCAMTEK LTD·Filed 2024·Application pending·0 cites
- 1564US12332176B2Dark field illumination based on laser illuminated phosphorCAMTEK LTD·Filed 2023·Granted Jun 17, 2025·0 cites·20 claims
- 1664US2022214287A1Automatic defect classificationCAMTEK LTD·Filed 2022·Application pending·0 cites
- 1761US12292374B1Crystallographic defect inspectionCAMTEK LTD·Filed 2024·Granted May 6, 2025·0 cites·29 claims
- 1861US9754812B2Adaptable end effectorCAMTEK LTD·Filed 2016·Granted Sep 5, 2017·2 cites·23 claims
- 1960US2023280282A1Continuous bump measurement height metrologyCAMTEK LTD·Filed 2021·Application pending·0 cites
- 2057US12315206B2Inspection system for edge and bevel inspection of semiconductor structuresCAMTEK LTD·Filed 2024·Granted May 27, 2025·0 cites·19 claims
- 2157US2016278216A1Curable ink and a method for printing and curing the curable inkCAMTEK LTD·Filed 2016·Application pending·0 cites
- 2255US2025305967A1Crystallographic Defect InspectionCAMTEK LTD·Filed 2025·Application pending·0 cites
- 2354US8363229B2System and method for height triangulation measurementCAMTEK LTD·Filed 2005·Granted Jan 29, 2013·4 cites·7 claims
- 2452US12474162B2Bump measurement height metrologyCAMTEK LTD·Filed 2021·Granted Nov 18, 2025·0 cites·21 claims
- 2552US11300521B2Automatic defect classificationCAMTEK LTD·Filed 2018·Granted Apr 12, 2022·0 cites·23 claims
- 2651US2011154764A1Composite structure for exterior insulation applicationsCAMTEK LTD·Filed 2008·Application pending·0 cites
- 2748US12467737B1Self-referencing interferometric microscopeCAMTEK LTD·Filed 2025·Granted Nov 11, 2025·0 cites·16 claims
- 2848US10989670B1Detection of pits using an automatic optical inspection systemCAMTEK LTD·Filed 2018·Granted Apr 27, 2021·0 cites·22 claims
- 2948US10823669B2Inspecting an object that includes a photo-sensitive polyimide layerCAMTEK LTD·Filed 2019·Granted Nov 3, 2020·0 cites·16 claims
- 3047US9781829B2Surface pretreatment and drop spreading control on multi component surfacesCAMTEK LTD·Filed 2014·Granted Oct 3, 2017·0 cites·17 claims
- 3147US9638644B2Multiple mode inspection system and method for evaluating a substrate by a multiple mode inspection systemCAMTEK LTD·Filed 2014·Granted May 2, 2017·0 cites·5 claims
- 3246US11682584B2Measuring buried layersCAMTEK LTD·Filed 2019·Granted Jun 20, 2023·0 cites·20 claims
- 3346US11055836B2Optical contrast enhancement for defect inspectionCAMTEK LTD·Filed 2019·Granted Jul 6, 2021·0 cites·22 claims
- 3445US2016321792A1System and a method for automatic recipe validation and selectionCAMTEK LTD·Filed 2016·Application pending·0 cites
- 3544US8358829B2System and a method for inspecting an objectCAMTEK LTD·Filed 2009·Granted Jan 22, 2013·2 cites·22 claims
- 3643US10732128B2Hierarchical wafer inspectionCAMTEK LTD·Filed 2018·Granted Aug 4, 2020·0 cites·21 claims
- 3742US9759555B2High throughput triangulation systemCAMTEK LTD·Filed 2016·Granted Sep 12, 2017·0 cites·24 claims
- 3842US7570799B2Morphological inspection method based on skeletonizationCAMTEK LTD·Filed 2003·Granted Aug 4, 2009·5 cites·13 claims
- 3942US2019355110A1Cross talk reductionCAMTEK LTD·Filed 2019·Application pending·0 cites
- 4041US2011094945A1Systems and method for imaging multiple sides of objectsCAMTEK LTD·Filed 2009·Application pending·0 cites
- 4140US2010117279A1Supporting system and a method for supporting an objectCAMTEK LTD·Filed 2007·Application pending·0 cites
- 4239US8573077B2Wafer inspection system and a method for translating wafersCAMTEK LTD·Filed 2012·Granted Nov 5, 2013·0 cites·13 claims
- 4339US2011190429A1Coloured ink and a method for formulating a colored inkCAMTEK LTD·Filed 2008·Application pending·0 cites
- 4438US2011032534A1System and a method for broadband interferometryCAMTEK LTD·Filed 2010·Application pending·0 cites
- 4536US10598607B2Objective lensCAMTEK LTD·Filed 2018·Granted Mar 24, 2020·0 cites·23 claims
- 4636US2011199480A1Optical inspection system using multi-facet imagingCAMTEK LTD·Filed 2010·Application pending·0 cites
- 4735US10734340B2Height measurements of conductive structural elements that are surrounded by a photoresist layerCAMTEK LTD·Filed 2019·Granted Aug 4, 2020·0 cites·20 claims
- 4835US9723722B2Selective solder mask printing on a printed circuit board (PCB)CAMTEK LTD·Filed 2016·Granted Aug 1, 2017·0 cites·17 claims
- 4935US2011164129A1Method and a system for creating a reference image using unknown quality patternsCAMTEK LTD·Filed 2006·Application pending·0 cites
- 5034US2016366315A1Aperture stopCAMTEK LTD·Filed 2016·Application pending·0 cites
Showing the top 50 of 62 patent records by PatentIndex Score.
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