Assignee
CARL ZEISS IND METROLOGY LLC
US·5 granted patents·30 citations·filing 2013–2021
Top patents by PatentIndex Score
5 records- 0187US10261028B2Device for optically inspecting a surface of a sampleCARL ZEISS IND METROLOGY LLC·Filed 2017·Granted Apr 16, 2019·7 cites·18 claims
- 0284US10598604B1Normal incidence phase-shifted deflectometry sensor, system, and method for inspecting a surface of a specimenCARL ZEISS IND METROLOGY LLC·Filed 2019·Granted Mar 24, 2020·6 cites·20 claims
- 0382US9109747B2Modular ceramic guideway memberCARL ZEISS IND METROLOGY LLC·Filed 2013·Granted Aug 18, 2015·17 cites·12 claims
- 0448US12175654B2Surface inspection system and method for differentiating particulate contamination from defects on a surface of a specimenCARL ZEISS IND METROLOGY LLC·Filed 2021·Granted Dec 24, 2024·0 cites·11 claims
- 0536US11633790B2Method for rapid development of additive manufacturing parameter setCARL ZEISS IND METROLOGY LLC·Filed 2020·Granted Apr 25, 2023·0 cites·34 claims
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