Assignee
CARL ZEISS MICROSCOPY LLC
US·13 granted patents·1 pending application·18 citations·filing 2013–2019
Top patents by PatentIndex Score
14 records- 0189US9236225B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted Jan 12, 2016·4 cites·23 claims
- 0286US9218935B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 22, 2015·5 cites·20 claims
- 0383US9218934B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 22, 2015·5 cites·18 claims
- 0482US9640364B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted May 2, 2017·2 cites·18 claims
- 0571US9012867B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Apr 21, 2015·1 cites·20 claims
- 0664US10410828B2Charged particle beam system and methodsCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted Sep 10, 2019·1 cites·22 claims
- 0761US9536699B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Jan 3, 2017·0 cites·20 claims
- 0860US9530611B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 27, 2016·0 cites·19 claims
- 0960US9530612B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 27, 2016·0 cites·28 claims
- 1058US9627172B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted Apr 18, 2017·0 cites·21 claims
- 1157US9029765B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2013·Granted May 12, 2015·0 cites·21 claims
- 1253US2019189392A1Charged particle beam system and methodsCARL ZEISS MICROSCOPY LLC·Filed 2019·Application pending·0 cites
- 1345US10354830B2Charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2017·Granted Jul 16, 2019·0 cites·10 claims
- 1442US10037862B2Charged particle detecting device and charged particle beam system with sameCARL ZEISS MICROSCOPY LLC·Filed 2016·Granted Jul 31, 2018·0 cites·20 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →