Assignee
Carl Zeiss Microscopy Ltd
GB·6 granted patents·17 citations·filing 2012–2016
Top patents by PatentIndex Score
6 records- 0188US9620331B1Method for analyzing an object and charged particle beam device for carrying out the methodCarl Zeiss Microscopy Ltd·Filed 2015·Granted Apr 11, 2017·10 cites·30 claims
- 0278US8648301B2Particle beam system having a hollow light guideCarl Zeiss Microscopy Ltd·Filed 2012·Granted Feb 11, 2014·4 cites·19 claims
- 0367US10049855B2Detecting charged particlesCarl Zeiss Microscopy Ltd·Filed 2016·Granted Aug 14, 2018·2 cites·20 claims
- 0461US9159532B2Method of analyzing a sample and charged particle beam device for analyzing a sampleCarl Zeiss Microscopy Ltd·Filed 2014·Granted Oct 13, 2015·1 cites·20 claims
- 0542US9726625B2Method and system for performing EDS analysisCarl Zeiss Microscopy Ltd·Filed 2015·Granted Aug 8, 2017·0 cites·20 claims
- 0626US10955368B2Method and data analysis system for semi-automated particle analysis using a charged particle beamCarl Zeiss Microscopy Ltd·Filed 2014·Granted Mar 23, 2021·0 cites·9 claims
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