Assignee
CASCADE MICROTECH INC
US·239 granted patents·25 pending applications·8,834 citations·filing 1984–2018
Top patents by PatentIndex Score
264 records- 0198US7271603B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2006·Granted Sep 18, 2007·51 cites·53 claims
- 0298US6842024B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2003·Granted Jan 11, 2005·84 cites·3 claims
- 0398US6806724B2Probe for combined signalsCASCADE MICROTECH INC·Filed 2003·Granted Oct 19, 2004·104 cites·8 claims
- 0498US6724205B1Probe for combined signalsCASCADE MICROTECH INC·Filed 2002·Granted Apr 20, 2004·110 cites·12 claims
- 0598US6549106B2Waveguide with adjustable backshortCASCADE MICROTECH INC·Filed 2001·Granted Apr 15, 2003·347 cites·19 claims
- 0698US6256882B1Membrane probing systemCASCADE MICROTECH INC·Filed 1998·Granted Jul 10, 2001·118 cites·35 claims
- 0798US5914613AMembrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 1996·Granted Jun 22, 1999·200 cites·15 claims
- 0898US5729150ALow-current probe card with reduced triboelectric current generating cablesCASCADE MICROTECH INC·Filed 1995·Granted Mar 17, 1998·187 cites·13 claims
- 0998US4697143AWafer probeCASCADE MICROTECH INC·Filed 1984·Granted Sep 29, 1987·257 cites·28 claims
- 1097US7626379B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2007·Granted Dec 1, 2009·39 cites·15 claims
- 1197US7403028B2Test structure and probe for differential signalsCASCADE MICROTECH INC·Filed 2007·Granted Jul 22, 2008·42 cites·3 claims
- 1297US7109731B2Membrane probing system with local contact scrubCASCADE MICROTECH INC·Filed 2005·Granted Sep 19, 2006·40 cites·15 claims
- 1397US7009383B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2004·Granted Mar 7, 2006·113 cites·8 claims
- 1497US6815963B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2003·Granted Nov 9, 2004·80 cites·51 claims
- 1597US6335628B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Jan 1, 2002·102 cites·5 claims
- 1697US6137302ALow-current probe card with reduced triboelectric current generating cablesCASCADE MICROTECH INC·Filed 1997·Granted Oct 24, 2000·127 cites·8 claims
- 1797US5610529AProbe station having conductive coating added to thermal chuck insulatorCASCADE MICROTECH INC·Filed 1995·Granted Mar 11, 1997·182 cites·18 claims
- 1897US5565788ACoaxial wafer probe with tip shieldingCASCADE MICROTECH INC·Filed 1995·Granted Oct 15, 1996·197 cites·4 claims
- 1997US5506515AHigh-frequency probe tip assemblyCASCADE MICROTECH INC·Filed 1994·Granted Apr 9, 1996·250 cites·15 claims
- 2097US4849689AMicrowave wafer probe having replaceable probe tipCASCADE MICROTECH INC·Filed 1988·Granted Jul 18, 1989·148 cites·12 claims
- 2196US7187188B2Chuck with integrated wafer supportCASCADE MICROTECH INC·Filed 2004·Granted Mar 6, 2007·90 cites·19 claims
- 2296US7161363B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2004·Granted Jan 9, 2007·64 cites·59 claims
- 2396US7068057B2Low-current pogo probe cardCASCADE MICROTECH INC·Filed 2005·Granted Jun 27, 2006·27 cites·11 claims
- 2496US6930498B2Membrane probing systemCASCADE MICROTECH INC·Filed 2004·Granted Aug 16, 2005·68 cites·1 claims
- 2596US6847219B1Probe station with low noise characteristicsCASCADE MICROTECH INC·Filed 2003·Granted Jan 25, 2005·116 cites·12 claims
- 2696US6608496B1Reference transmission line junction for probing deviceCASCADE MICROTECH INC·Filed 2000·Granted Aug 19, 2003·63 cites·6 claims
- 2796US6578264B1Method for constructing a membrane probe using a depressionCASCADE MICROTECH INC·Filed 2000·Granted Jun 17, 2003·96 cites·40 claims
- 2896US6492822B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Dec 10, 2002·64 cites·8 claims
- 2996US6362636B1Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2001·Granted Mar 26, 2002·58 cites·1 claims
- 3096US5457398AWafer probe station having full guardingCASCADE MICROTECH INC·Filed 1993·Granted Oct 10, 1995·149 cites·22 claims
- 3196US5345170AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1992·Granted Sep 6, 1994·166 cites·7 claims
- 3295US7876114B2Differential waveguide probeCASCADE MICROTECH INC·Filed 2008·Granted Jan 25, 2011·42 cites·20 claims
- 3395US7533462B2Method of constructing a membrane probeCASCADE MICROTECH INC·Filed 2006·Granted May 19, 2009·25 cites·15 claims
- 3495US7518358B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2007·Granted Apr 14, 2009·17 cites·12 claims
- 3595US7148711B2Membrane probing systemCASCADE MICROTECH INC·Filed 2005·Granted Dec 12, 2006·25 cites·1 claims
- 3695US6720782B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2002·Granted Apr 13, 2004·53 cites·8 claims
- 3795US6639415B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2002·Granted Oct 28, 2003·52 cites·3 claims
- 3895US6636059B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2002·Granted Oct 21, 2003·57 cites·15 claims
- 3995US6489789B2Probe station having multiple enclosuresCASCADE MICROTECH INC·Filed 2001·Granted Dec 3, 2002·53 cites·1 claims
- 4095US6486687B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2002·Granted Nov 26, 2002·59 cites·7 claims
- 4195US5869975ASystem for evaluating probing networks that have multiple probing endsCASCADE MICROTECH INC·Filed 1997·Granted Feb 9, 1999·90 cites·12 claims
- 4295US5604444AWafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 1996·Granted Feb 18, 1997·107 cites·9 claims
- 4395US5561377ASystem for evaluating probing networksCASCADE MICROTECH INC·Filed 1995·Granted Oct 1, 1996·84 cites·12 claims
- 4495US5045781AHigh-frequency active probe having replaceable contact needlesCASCADE MICROTECH INC·Filed 1991·Granted Sep 3, 1991·123 cites·6 claims
- 4595US4858160ASystem for setting reference reactance for vector corrected measurementsCASCADE MICROTECH INC·Filed 1988·Granted Aug 15, 1989·112 cites·19 claims
- 4695US4764723AWafer probeCASCADE MICROTECH INC·Filed 1986·Granted Aug 16, 1988·103 cites·17 claims
- 4794US7893704B2Membrane probing structure with laterally scrubbing contactsCASCADE MICROTECH INC·Filed 2009·Granted Feb 22, 2011·18 cites·34 claims
- 4894US7888957B2Probing apparatus with impedance optimized interfaceCASCADE MICROTECH INC·Filed 2008·Granted Feb 15, 2011·28 cites·13 claims
- 4994US7764072B2Differential signal probing systemCASCADE MICROTECH INC·Filed 2007·Granted Jul 27, 2010·26 cites·26 claims
- 5094US7501810B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2007·Granted Mar 10, 2009·16 cites·10 claims
Showing the top 50 of 264 patent records by PatentIndex Score.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →