Assignee
CHAKRAVARTY SREEJIT
US·9 granted patents·3 pending applications·31 citations·filing 2008–2022
Top patents by PatentIndex Score
12 records- 0185US8473792B2Logic BIST for system testing using stored patternsCHAKRAVARTY SREEJIT·Filed 2011·Granted Jun 25, 2013·6 cites·19 claims
- 0277US8090965B1System and method for testing memory power management modes in an integrated circuitCHAKRAVARTY SREEJIT·Filed 2008·Granted Jan 3, 2012·8 cites·23 claims
- 0371US8711645B2Victim port-based design for test area overhead reduction in multiport latch-based memoriesCHAKRAVARTY SREEJIT·Filed 2012·Granted Apr 29, 2014·4 cites·16 claims
- 0469US8464198B1Electronic design automation tool and method for employing unsensitized critical path information to reduce leakage power in an integrated circuitCHAKRAVARTY SREEJIT·Filed 2008·Granted Jun 11, 2013·4 cites·20 claims
- 0565US8228750B2Low cost comparator design for memory BISTCHAKRAVARTY SREEJIT·Filed 2010·Granted Jul 24, 2012·3 cites·20 claims
- 0664US8499230B2Critical path monitor for an integrated circuit and method of operation thereofCHAKRAVARTY SREEJIT·Filed 2008·Granted Jul 30, 2013·1 cites·20 claims
- 0761US8656233B2Scan cell designs with serial and parallel loading of test dataCHAKRAVARTY SREEJIT·Filed 2010·Granted Feb 18, 2014·1 cites·13 claims
- 0860US8418008B2Test technique to apply a variable scan clock including a scan clock modifier on an integrated circuitCHAKRAVARTY SREEJIT·Filed 2008·Granted Apr 9, 2013·4 cites·22 claims
- 0948US2024027516A1Test and repair of interconnects between chipsCHAKRAVARTY SREEJIT·Filed 2022·Application pending·0 cites
- 1038US8793549B2Low-cost design for register file testabilityCHAKRAVARTY SREEJIT·Filed 2010·Granted Jul 29, 2014·0 cites·20 claims
- 1138US2012173938A1Scan cell designs with serial and parallel loading of test dataCHAKRAVARTY SREEJIT·Filed 2010·Application pending·0 cites
- 1236US2013111285A1Scan test circuitry comprising scan cells with functional output multiplexingCHAKRAVARTY SREEJIT·Filed 2011·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →