Assignee
CHECKPOINT TECHNOLOGIES LLC
US·7 granted patents·3 pending applications·80 citations·filing 1998–2014
Top patents by PatentIndex Score
10 records- 0184US9217855B1Multi-magnification high sensitivity optical system for probing electronic devicesCHECKPOINT TECHNOLOGIES LLC·Filed 2013·Granted Dec 22, 2015·8 cites·19 claims
- 0282US9030658B1Multi-resolution optical probing system having reliable temperature control and mechanical isolationCHECKPOINT TECHNOLOGIES LLC·Filed 2013·Granted May 12, 2015·6 cites·22 claims
- 0380US9182580B1Optical probe system having accurate positional and orientational adjustments for multiple optical objectivesCHECKPOINT TECHNOLOGIES LLC·Filed 2013·Granted Nov 10, 2015·6 cites·22 claims
- 0477US6168311B1System and method for optically determining the temperature of a test objectCHECKPOINT TECHNOLOGIES LLC·Filed 1998·Granted Jan 2, 2001·53 cites·39 claims
- 0576US8749784B1Probing circuit features in sub-32 nm semiconductor integrated circuitCHECKPOINT TECHNOLOGIES LLC·Filed 2012·Granted Jun 10, 2014·4 cites·15 claims
- 0675US8873032B1Optical probing system having reliable temperature controlCHECKPOINT TECHNOLOGIES LLC·Filed 2013·Granted Oct 28, 2014·3 cites·20 claims
- 0752US9025147B1Probing circuit features in sub-32 NM semiconductor integrated circuitCHECKPOINT TECHNOLOGIES LLC·Filed 2014·Granted May 5, 2015·0 cites·17 claims
- 0846US2015153232A1Microscope with detector stop matchingCHECKPOINT TECHNOLOGIES LLC·Filed 2013·Application pending·0 cites
- 0941US2015219709A1Remotely aligned wafer probe station for semiconductor optical analysis systemsCHECKPOINT TECHNOLOGIES LLC·Filed 2014·Application pending·0 cites
- 1036US2015103181A1Auto-flat field for image acquisitionCHECKPOINT TECHNOLOGIES LLC·Filed 2013·Application pending·0 cites
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