Assignee
CHEN CHIEN-HUEI
US·2 granted patents·1 pending application·18 citations·filing 2011–2012
Top patents by PatentIndex Score
3 records- 0189US8502146B2Methods and apparatus for classification of defects using surface height attributesCHEN CHIEN-HUEI·Filed 2011·Granted Aug 6, 2013·13 cites·20 claims
- 0279US8669523B2Contour-based defect detection using an inspection apparatusCHEN CHIEN-HUEI·Filed 2012·Granted Mar 11, 2014·5 cites·10 claims
- 0338US2012223227A1Apparatus and methods for real-time three-dimensional sem imaging and viewing of semiconductor wafersCHEN CHIEN-HUEI·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →