Assignee
CHEN JUI-LONG
TW·4 granted patents·14 citations·filing 2010–2012
Top patents by PatentIndex Score
4 records- 0186US8627251B2Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processesCHEN JUI-LONG·Filed 2012·Granted Jan 7, 2014·7 cites·20 claims
- 0273US8406912B2System and method for data mining and feature tracking for fab-wide prediction and controlCHEN JUI-LONG·Filed 2010·Granted Mar 26, 2013·3 cites·17 claims
- 0367US9000798B2Method of test probe alignment controlCHEN JUI-LONG·Filed 2012·Granted Apr 7, 2015·2 cites·20 claims
- 0466US8391999B2Auto device skew manufacturingCHEN JUI-LONG·Filed 2010·Granted Mar 5, 2013·2 cites·20 claims
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