Assignee
CHENG MEI INSTRUMENT TECH CO LTD
TW·2 granted patents·7 pending applications·0 citations·filing 2019–2025
Top patents by PatentIndex Score
9 records- 0164US2026038110A1Wafer inspection system and method utilizing artificial intelligence machine learning modelsCHENG MEI INSTRUMENT TECH CO LTD·Filed 2025·Application pending·0 cites
- 0258US12523619B2Method and device of inspecting surface of interconnect structureCHENG MEI INSTRUMENT TECH CO LTD·Filed 2024·Granted Jan 13, 2026·0 cites·20 claims
- 0354US2025216343A1Method and device of inspecting surface of interconnect structureCHENG MEI INSTRUMENT TECH CO LTD·Filed 2024·Application pending·0 cites
- 0454US2025244252A1Inspection device and inspection methodCHENG MEI INSTRUMENT TECH CO LTD·Filed 2024·Application pending·0 cites
- 0549US2025112084A1Mechanism for fine adjusting an angle of a semiconductor wafer fixtureCHENG MEI INSTRUMENT TECH CO LTD·Filed 2023·Application pending·0 cites
- 0643US12529466B2Illumination system and illumination methodCHENG MEI INSTRUMENT TECH CO LTD·Filed 2024·Granted Jan 20, 2026·0 cites·16 claims
- 0736US2021313207A1Wafer image capturing apparatus and method of wafer image capturingCHENG MEI INSTRUMENT TECH CO LTD·Filed 2021·Application pending·0 cites
- 0829US2021287397A1Image calibration method for imaging systemCHENG MEI INSTRUMENT TECH CO LTD·Filed 2020·Application pending·0 cites
- 0926US2020105020A1Method of spectral analyzing with a color cameraCHENG MEI INSTRUMENT TECH CO LTD·Filed 2019·Application pending·0 cites
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