Assignee
CHENG WU-TUNG
10 granted patents·1 pending application·166 citations·filing 2003–2011
Top patents by PatentIndex Score
11 records- 0196US7395473B2Removing the effects of unknown test values from compacted test responsesCHENG WU-TUNG·Filed 2005·Granted Jul 1, 2008·34 cites·34 claims
- 0290US8280687B2Direct fault diagnostics using per-pattern compactor signaturesCHENG WU-TUNG·Filed 2006·Granted Oct 2, 2012·20 cites·45 claims
- 0390US7716548B2Removing the effects of unknown test values from compacted test responsesCHENG WU-TUNG·Filed 2008·Granted May 11, 2010·16 cites·37 claims
- 0487US7239978B2Compactor independent fault diagnosisCHENG WU-TUNG·Filed 2004·Granted Jul 3, 2007·45 cites·46 claims
- 0584US8607107B2Test access mechanism for diagnosis based on partitioining scan chainsCHENG WU-TUNG·Filed 2011·Granted Dec 10, 2013·5 cites·24 claims
- 0683US8843796B2Profiling-based scan chain diagnosisCHENG WU-TUNG·Filed 2011·Granted Sep 23, 2014·5 cites·18 claims
- 0783US8086923B2Accurately identifying failing scan bits in compression environmentsCHENG WU-TUNG·Filed 2008·Granted Dec 27, 2011·11 cites·7 claims
- 0873US8301414B2Compactor independent fault diagnosisCHENG WU-TUNG·Filed 2007·Granted Oct 30, 2012·5 cites·29 claims
- 0969US7200786B2Built-in self-analyzer for embedded memoryCHENG WU-TUNG·Filed 2003·Granted Apr 3, 2007·17 cites·58 claims
- 1056US7721174B2Full-speed BIST controller for testing embedded synchronous memoriesCHENG WU-TUNG·Filed 2004·Granted May 18, 2010·8 cites·15 claims
- 1148US2009287438A1Increased Fault Diagnosis Throughput Using Dictionaries For Hyperactive FaultsCHENG WU-TUNG·Filed 2008·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when CHENG WU-TUNG files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →