Assignee
CHIBA TADASHI
JP·3 granted patents·1 pending application·7 citations·filing 2005–2009
Top patents by PatentIndex Score
4 records- 0167US8395121B2Visible-region light measuring instrument and visible-region light measuring instrument manufacturing methodCHIBA TADASHI·Filed 2009·Granted Mar 12, 2013·1 cites·15 claims
- 0265US8077304B2Light amount measuring apparatusCHIBA TADASHI·Filed 2009·Granted Dec 13, 2011·4 cites·7 claims
- 0356US8134105B2Light quantity measuring device and method for measuring light quantity that selectively connects light reception elements based on incident light angleCHIBA TADASHI·Filed 2009·Granted Mar 13, 2012·2 cites·1 claims
- 0433US2006012009A1Semiconductor deviceCHIBA TADASHI·Filed 2005·Application pending·0 cites
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