Assignee
CHIKAMATSU SHUICHI
JP·2 granted patents·1 pending application·0 citations·filing 2009–2010
Technology mixG01N3
Top patents by PatentIndex Score
3 records- 0151US8134701B2Defect inspecting method and apparatusCHIKAMATSU SHUICHI·Filed 2010·Granted Mar 13, 2012·0 cites·5 claims
- 0247US8228496B2Defect inspection method and defect inspection apparatusCHIKAMATSU SHUICHI·Filed 2010·Granted Jul 24, 2012·0 cites·11 claims
- 0347US2011141463A1Defect inspection method, and defect inspection deviceCHIKAMATSU SHUICHI·Filed 2009·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →