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CHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES
CN·3 granted patents·2 pending applications·0 citations·filing 2024–2025
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5 records- 0157US12339310B1Method for monitoring degradation mechanism of switch device in power conversion circuitCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2025·Granted Jun 24, 2025·0 cites·8 claims
- 0257US12124248B1Method and apparatus for processing accelerated test data based on multiple performance degradation, and computer deviceCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2024·Granted Oct 22, 2024·0 cites·7 claims
- 0355US2024386339A1Accelerated Test Data Analysis Method And Apparatus Based On Gray Forecast Model, And DeviceCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2024·Application pending·0 cites
- 0449US12494384B1Chip defect modifying device and methodCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2025·Granted Dec 9, 2025·0 cites·3 claims
- 0548US2025290830A1Integrated Product Testing Method and Device Combining Accelerated Life Test and Accelerated Degradation TestCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2025·Application pending·0 cites
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