Assignee
CHO YONG-MIN
KR·1 granted patent·1 pending application·2 citations·filing 2011–2012
Top patents by PatentIndex Score
2 records- 0162US8952716B2Method of detecting defects in a semiconductor device and semiconductor device using the sameCHO YONG MIN·Filed 2012·Granted Feb 10, 2015·2 cites·18 claims
- 0231US2012155740A1Method of detecting defect in pattern and apparatus for performing the sameCHO YONG-MIN·Filed 2011·Application pending·0 cites
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