Assignee
CHOPRA HARSH DEEP
2 granted patents·0 citations·filing 2006–2010
Top patents by PatentIndex Score
2 records- 0135US8397311B2Metrology probe and method of configuring a metrology probeCHOPRA HARSH DEEP·Filed 2010·Granted Mar 12, 2013·0 cites·28 claims
- 0228US7425826B2Selectively conductive structure wherein a magnetic conductor is sized to have a cross-section diameter similar to a Fermi wavelength of electronsCHOPRA HARSH DEEP·Filed 2006·Granted Sep 16, 2008·0 cites·21 claims
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