Assignee
CHU YIJ-CHIEH
TW·4 granted patents·1 pending application·5 citations·filing 2009–2011
Top patents by PatentIndex Score
5 records- 0169US8756028B2Fault detection method of semiconductor manufacturing processes and system architecture thereofCHU YIJ CHIEH·Filed 2011·Granted Jun 17, 2014·3 cites·9 claims
- 0265US8649990B2Method for detecting variance in semiconductor processesCHU YIJ CHIEH·Filed 2011·Granted Feb 11, 2014·2 cites·20 claims
- 0344US8510610B2Method and system of compressing raw fabrication data for fault determinationCHU YIJ CHIEH·Filed 2011·Granted Aug 13, 2013·0 cites·10 claims
- 0444US8265903B2Method for assessing data worth for analyzing yield rateCHU YIJ CHIEH·Filed 2009·Granted Sep 11, 2012·0 cites·7 claims
- 0535US2011137595A1Yield loss prediction method and associated computer readable mediumCHU YIJ-CHIEH·Filed 2010·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →