Assignee
CHUNGHWA PREC TEST TECH CO LTD
TW·51 granted patents·15 pending applications·44 citations·filing 2013–2025
Top patents by PatentIndex Score
66 records- 0195US11226354B1Probe card device and fence-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Jan 18, 2022·6 cites·9 claims
- 0294US11460486B1Probe card device and spring-like probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Oct 4, 2022·3 cites·10 claims
- 0393US11913973B2Cantilever probe card device and focusing probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Feb 27, 2024·4 cites·9 claims
- 0493US11879912B2Cantilever probe card and carrier thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Jan 23, 2024·4 cites·10 claims
- 0592US11561244B2Board-like connector, dual-ring bridge of board-like connector, and wafer testing assemblyCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Jan 24, 2023·2 cites·10 claims
- 0691US12467949B2Cantilever probe card device and light absorption probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Granted Nov 11, 2025·2 cites·10 claims
- 0791US10845385B2Probe card deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Nov 24, 2020·5 cites·6 claims
- 0890US12181496B2Cantilever probe card and probe module thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Dec 31, 2024·2 cites·10 claims
- 0990US12092661B2Cantilever probe card device and elastic probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Sep 17, 2024·2 cites·10 claims
- 1088US10613117B2Probe card device and rectangular probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Apr 7, 2020·4 cites·10 claims
- 1183US10060949B2Probe device of vertical probe cardCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Granted Aug 28, 2018·4 cites·13 claims
- 1280US10845387B2Probe card device and matching probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Nov 24, 2020·2 cites·10 claims
- 1377US10779407B1Multilayer circuit board and manufacturing method thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Sep 15, 2020·2 cites·13 claims
- 1473US10605830B2Probe card device and rectangular probe thereof having ring-shaped branch segmentCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Mar 31, 2020·1 cites·11 claims
- 1568US10317429B2Bolt type probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Granted Jun 11, 2019·1 cites·10 claims
- 1659US12590994B2Cantilever probe card device and solder receiving probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Granted Mar 31, 2026·0 cites·10 claims
- 1759US12590990B2Cantilever probe card device and micro electro mechanical system (MEMS) probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Granted Mar 31, 2026·0 cites·12 claims
- 1858US11988686B2Vertical probe card and fence-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted May 21, 2024·0 cites·10 claims
- 1958US2025283915A1Probe card device having expansion configuration and probe head thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2025·Application pending·0 cites
- 2058US2025283914A1Probe card device having heat-dissipation configuration and guide board module thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2025·Application pending·0 cites
- 2158US2025283912A1Probe card device having parallel connection configuration and guide board mechanism thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2025·Application pending·0 cites
- 2256US2024385217A1Cantilever probe card device and climb-restricting probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Application pending·0 cites
- 2356US2024385222A1Cantilever probe card device and cantilever probe moduleCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Application pending·0 cites
- 2456US2025350356A1Optoelectronic integrated circuit testing devicesCHUNGHWA PREC TEST TECH CO LTD·Filed 2025·Application pending·0 cites
- 2555US12111336B2Modular vertical probe cardCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Oct 8, 2024·0 cites·9 claims
- 2653US12203961B2Vertical probe card device and fence-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Jan 21, 2025·0 cites·8 claims
- 2753US12146897B2Vertical probe card having different probesCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Nov 19, 2024·0 cites·9 claims
- 2853US11747395B2Board-like connector, single-arm bridge of board-like connector, and wafer testing assemblyCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Sep 5, 2023·0 cites·10 claims
- 2952US11506685B1Probe card device and disposable adjustment film thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Nov 22, 2022·0 cites·10 claims
- 3051US11699871B2Board-like connector, dual-arm bridge of board-like connector, and wafer testing assemblyCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Jul 11, 2023·0 cites·10 claims
- 3151US11592466B2Probe card device and self-aligned probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Feb 28, 2023·0 cites·8 claims
- 3250US11536744B2Probe card device and dual-arm probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2021·Granted Dec 27, 2022·0 cites·8 claims
- 3349US11933817B2Probe card device and transmission structureCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Mar 19, 2024·0 cites·5 claims
- 3449US10509057B2Probe assembly and probe structure thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Dec 17, 2019·0 cites·22 claims
- 3548US11287446B2Split thin-film probe cardCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Mar 29, 2022·0 cites·6 claims
- 3648US10514390B2Probe structureCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Granted Dec 24, 2019·0 cites·16 claims
- 3747US11209461B2Probe card device and neck-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Dec 28, 2021·0 cites·8 claims
- 3847US9970960B2Sliding rail type probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2017·Granted May 15, 2018·0 cites·13 claims
- 3946US10845388B2Probe card device and probe head thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Nov 24, 2020·0 cites·10 claims
- 4045US11204371B2Probe card deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Dec 21, 2021·0 cites·6 claims
- 4145US11175313B1Thin-film probe card and test module thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Nov 16, 2021·0 cites·10 claims
- 4245US11009526B2Probe card device and three-dimensional signal transfer structure thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted May 18, 2021·0 cites·8 claims
- 4345US10775412B2Probe card testing device and testing deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Sep 15, 2020·0 cites·10 claims
- 4444US12504465B2Test device for optoelectronic integrated circuitCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Granted Dec 23, 2025·0 cites·10 claims
- 4544US11119139B2Integrated circuit with antenna in package testing apparatusCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Sep 14, 2021·0 cites·7 claims
- 4644US11073537B2Probe card deviceCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted Jul 27, 2021·0 cites·7 claims
- 4744US11009524B2High speed probe card device and rectangular probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Granted May 18, 2021·0 cites·10 claims
- 4844US10149384B1Support structure and manufacture method thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2018·Granted Dec 4, 2018·0 cites·2 claims
- 4944US2022011346A1Probe card device and fan-out probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2020·Application pending·0 cites
- 5043US11041883B2Probe card device and rectangular probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2019·Granted Jun 22, 2021·0 cites·6 claims
Showing the top 50 of 66 patent records by PatentIndex Score.
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