Assignee
CHUO ELECTRONIC MEASUREMENT CO
JP·5 granted patents·1 pending application·226 citations·filing 1991–2007
Top patents by PatentIndex Score
6 records- 0193US5379104AMethod of, and apparatus for, detecting optical axis of headlampCHUO ELECTRONIC MEASUREMENT CO·Filed 1994·Granted Jan 3, 1995·92 cites·4 claims
- 0283US5268731AWheel alignment measuring apparatusCHUO ELECTRONIC MEASUREMENT CO·Filed 1992·Granted Dec 7, 1993·60 cites·3 claims
- 0362US6398870B1Coating defect detecting and marking systemCHUO ELECTRONIC MEASUREMENT CO·Filed 1999·Granted Jun 4, 2002·27 cites·24 claims
- 0457US5426500AIlluminance measurement of vehicle lampCHUO ELECTRONIC MEASUREMENT CO·Filed 1994·Granted Jun 20, 1995·28 cites·11 claims
- 0554US5210589AApparatus for measuring optical-axis deflection angle of headlightCHUO ELECTRONIC MEASUREMENT CO·Filed 1991·Granted May 11, 1993·19 cites·4 claims
- 0639US2007229810A1Illuminating method in paint defect detecting machineCHUO ELECTRONIC MEASUREMENT CO·Filed 2007·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →