Assignee
CROSSCHECK TECHNOLOGY INC
US·9 granted patents·227 citations·filing 1988–1993
Top patents by PatentIndex Score
9 records- 0184US4937826AMethod and apparatus for sensing defects in integrated circuit elementsCROSSCHECK TECHNOLOGY INC·Filed 1988·Granted Jun 26, 1990·44 cites·14 claims
- 0282US5495486AMethod and apparatus for testing integrated circuitsCROSSCHECK TECHNOLOGY INC·Filed 1992·Granted Feb 27, 1996·48 cites·21 claims
- 0372US4975640AMethod for operating a linear feedback shift register as a serial shift register with a crosscheck grid structureCROSSCHECK TECHNOLOGY INC·Filed 1990·Granted Dec 4, 1990·34 cites·6 claims
- 0467US5179534AMethod and apparatus for setting desired logic state at internal point of a select storage elementCROSSCHECK TECHNOLOGY INC·Filed 1990·Granted Jan 12, 1993·21 cites·11 claims
- 0565US5157627AMethod and apparatus for setting desired signal level on storage elementCROSSCHECK TECHNOLOGY INC·Filed 1990·Granted Oct 20, 1992·26 cites·24 claims
- 0660US5471152AStorage element for delay testingCROSSCHECK TECHNOLOGY INC·Filed 1993·Granted Nov 28, 1995·25 cites·6 claims
- 0750US5206862AMethod and apparatus for locally deriving test signals from previous response signalsCROSSCHECK TECHNOLOGY INC·Filed 1991·Granted Apr 27, 1993·15 cites·7 claims
- 0844US5230001AMethod for testing a sequential circuit by splicing test vectors into sequential test patternCROSSCHECK TECHNOLOGY INC·Filed 1991·Granted Jul 20, 1993·12 cites·5 claims
- 0929US5436801AMethod and structure for routing power for optimum cell utilization with two and three level metal in a partially predesigned integrated circuitCROSSCHECK TECHNOLOGY INC·Filed 1993·Granted Jul 25, 1995·2 cites·10 claims
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