Assignee
DASTIDAR JAYABRATA GHOSH
US·3 granted patents·18 citations·filing 2010–2012
Top patents by PatentIndex Score
3 records- 0181US8327199B1Integrated circuit with configurable test pinsDASTIDAR JAYABRATA GHOSH·Filed 2010·Granted Dec 4, 2012·7 cites·20 claims
- 0278US8952713B1Method and apparatus for die testingDASTIDAR JAYABRATA GHOSH·Filed 2012·Granted Feb 10, 2015·7 cites·17 claims
- 0371US8259522B1Area-efficient memory built-in-self-test circuitry with advanced debug capabilities for distributed memory blocksDASTIDAR JAYABRATA GHOSH·Filed 2011·Granted Sep 4, 2012·4 cites·18 claims
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