Assignee
DAUB MICHAEL
DE·1 granted patent·1 pending application·4 citations·filing 2007–2019
Top patents by PatentIndex Score
2 records- 0156US8326565B2Chip tester, method for providing timing information, test fixture set, apparatus for post-processing propagation delay information, method for post-processing delay information, chip test set up and method for testing devices under testDAUB MICHAEL·Filed 2007·Granted Dec 4, 2012·4 cites·28 claims
- 0252US2021004481A1Systems and methods for privacy preserving determination of intersections of sets of user identifiersDAUB MICHAEL·Filed 2019·Application pending·0 cites
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