Assignee
DECKER DAVID L
US·2 granted patents·1 pending application·5 citations·filing 2007–2010
Top patents by PatentIndex Score
3 records- 0171US8727024B2Sampling system and methodDECKER DAVID L·Filed 2010·Granted May 20, 2014·5 cites·17 claims
- 0239US8418760B2Sampling system and methodDECKER DAVID L·Filed 2010·Granted Apr 16, 2013·0 cites·17 claims
- 0331US2009114828A1Radiation monitoring device and methods of useDECKER DAVID L·Filed 2007·Application pending·0 cites
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