Assignee
DELMIC B V
NL·4 granted patents·11 citations·filing 2013–2015
Top patents by PatentIndex Score
4 records- 0181US10651009B2Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscopeDELMIC B V·Filed 2015·Granted May 12, 2020·4 cites·34 claims
- 0274US9378921B2Integrated optical and charged particle inspection apparatusDELMIC B V·Filed 2013·Granted Jun 28, 2016·4 cites·18 claims
- 0370US9715992B2Integrated optical and charged particle inspection apparatusDELMIC B V·Filed 2013·Granted Jul 25, 2017·3 cites·17 claims
- 0444US10132753B2Method and apparatus for determining a density of fluorescent markers in a sampleDELMIC B V·Filed 2015·Granted Nov 20, 2018·0 cites·22 claims
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