Assignee
DEWA HARUTADA
JP·3 granted patents·5 citations·filing 2011–2012
Top patents by PatentIndex Score
3 records- 0174US9164149B2Testing device and testing method for quantum battery using semiconductor probeDEWA HARUTADA·Filed 2011·Granted Oct 20, 2015·2 cites·20 claims
- 0271US9778284B2Semiconductor probe, testing device and testing method for testing quantum batteryDEWA HARUTADA·Filed 2012·Granted Oct 3, 2017·3 cites·22 claims
- 0341US10036780B2Evaluation apparatus and evaluation method of sheet type cellDEWA HARUTADA·Filed 2011·Granted Jul 31, 2018·0 cites·14 claims
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