Assignee
DONGBU ELECTRONICS CO LTD
KR·815 granted patents·88 pending applications·4,062 citations·filing 1999–2010
Top patents by PatentIndex Score
903 records- 0198US7675126B2Metal oxide semiconductor field effect transistor and method of fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Mar 9, 2010·125 cites·14 claims
- 0298US7468319B2Method for preventing a metal corrosion in a semiconductor deviceDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Dec 23, 2008·181 cites·19 claims
- 0397US7211871B2Transistors of semiconductor devices and methods of fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2004·Granted May 1, 2007·123 cites·5 claims
- 0496US7973342B2CMOS image sensor and method for manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2009·Granted Jul 5, 2011·34 cites·20 claims
- 0596US7482238B2Method for manufacturing semiconductor deviceDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Jan 27, 2009·157 cites·1 claims
- 0695US7595210B2Method of manufacturing complementary metal oxide semiconductor image sensorDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Sep 29, 2009·34 cites·7 claims
- 0795US7588986B2Method of manufacturing a semiconductor deviceDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Sep 15, 2009·34 cites·20 claims
- 0895US7354841B2Method for fabricating photodiode of CMOS image sensorDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Apr 8, 2008·33 cites·9 claims
- 0993US7244668B2Methods of manufacturing semiconductor devicesDONGBU ELECTRONICS CO LTD·Filed 2004·Granted Jul 17, 2007·84 cites·19 claims
- 1091US7500564B2Wafer carrying apparatusDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Mar 10, 2009·19 cites·21 claims
- 1191US7329570B2Method for manufacturing a semiconductor deviceDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Feb 12, 2008·16 cites·12 claims
- 1290US7407881B2Semiconductor device and method for manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Aug 5, 2008·14 cites·17 claims
- 1390US7385241B2Vertical-type capacitor structureDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Jun 10, 2008·19 cites·4 claims
- 1489US7605016B2CMOS image sensor and method of manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Oct 20, 2009·32 cites·11 claims
- 1589US7453110B2CMOS image sensor and method for manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Nov 18, 2008·12 cites·7 claims
- 1689US7405437B2CMOS image sensor and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Jul 29, 2008·12 cites·8 claims
- 1789US7339155B2CMOS image sensor and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Mar 4, 2008·12 cites·15 claims
- 1889US7238562B2Method for fabricating CMOS image sensorDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Jul 3, 2007·14 cites·13 claims
- 1989US7217627B2Semiconductor devices having diffusion barrier regions and halo implant regions and methods of fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2004·Granted May 15, 2007·47 cites·20 claims
- 2089US7129108B2CMOS image sensor and manufacturing method thereofDONGBU ELECTRONICS CO LTD·Filed 2004·Granted Oct 31, 2006·50 cites·20 claims
- 2188US7732246B2Method for fabricating vertical CMOS image sensorDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Jun 8, 2010·11 cites·29 claims
- 2288US7592828B2Method and device of measuring interface trap density in semiconductor deviceDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Sep 22, 2009·22 cites·10 claims
- 2388US7279354B2Microlens of CMOS image sensor and method of manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Oct 9, 2007·12 cites·3 claims
- 2488US7232712B2CMOS image sensor and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2004·Granted Jun 19, 2007·45 cites·15 claims
- 2588US6433376B2Ferroelectric memory integrated circuitDONGBU ELECTRONICS CO LTD·Filed 2000·Granted Aug 13, 2002·41 cites·4 claims
- 2687US7651949B2Method of manufacturing a semiconductor deviceDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Jan 26, 2010·17 cites·20 claims
- 2787US7556998B2Method of manufacturing semiconductor devicesDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Jul 7, 2009·30 cites·4 claims
- 2886US7569884B2LDMOS transistorDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Aug 4, 2009·15 cites·9 claims
- 2986US7544530B2CMOS image sensor and manufacturing method thereofDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Jun 9, 2009·8 cites·14 claims
- 3086US7488616B2CMOS image sensor and method for manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Feb 10, 2009·8 cites·12 claims
- 3186US7341885B2CMOS image sensor and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Mar 11, 2008·9 cites·15 claims
- 3286US7315359B2Method for monitoring micro-lens curvature in-lineDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Jan 1, 2008·16 cites·19 claims
- 3386US7217967B2CMOS image sensor and method for manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2003·Granted May 15, 2007·33 cites·19 claims
- 3485US7723151B2CMOS image sensor and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted May 25, 2010·12 cites·9 claims
- 3585US7579639B2CMOS image sensor and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Aug 25, 2009·10 cites·11 claims
- 3685US7560674B2CMOS image sensor and method for manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Jul 14, 2009·8 cites·20 claims
- 3785US7397076B2CMOS image sensor with dark current reductionDONGBU ELECTRONICS CO LTD·Filed 2004·Granted Jul 8, 2008·38 cites·18 claims
- 3885US7372122B2Image sensor chip package and method of fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted May 13, 2008·14 cites·17 claims
- 3985US7119001B2Semiconductor chip packages and methods for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2004·Granted Oct 10, 2006·46 cites·12 claims
- 4084US7741667B2CMOS image sensor for improving the amount of light incident a photodiodeDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Jun 22, 2010·12 cites·9 claims
- 4184US7358563B2CMOS image sensor and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Apr 15, 2008·7 cites·12 claims
- 4284US7348243B2Semiconductor device and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2004·Granted Mar 25, 2008·35 cites·20 claims
- 4384US7229878B2Phototransistor of CMOS image sensor and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Jun 12, 2007·8 cites·16 claims
- 4484US6441478B2Semiconductor package having metal-pattern bonding and method of fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2001·Granted Aug 27, 2002·54 cites·30 claims
- 4583US7612318B2Complementary metal oxide semiconductor image sensor having cross talk prevention and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2004·Granted Nov 3, 2009·34 cites·7 claims
- 4683US7589372B2Nonvolatile memory device and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2008·Granted Sep 15, 2009·10 cites·18 claims
- 4783US7582533B2LDMOS device and method for manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Sep 1, 2009·11 cites·10 claims
- 4883US7416912B2Method of fabricating CMOS image sensorDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Aug 26, 2008·6 cites·20 claims
- 4983US7358574B2Semiconductor device having silicide-blocking layer and fabrication method thereofDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Apr 15, 2008·11 cites·6 claims
- 5083US7348202B2CMOS image sensor and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Mar 25, 2008·7 cites·4 claims
Showing the top 50 of 903 patent records by PatentIndex Score.
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