Assignee
DONGFANG JINGYUAN ELECTRON LTD
CN·13 granted patents·3 pending applications·48 citations·filing 2015–2023
Top patents by PatentIndex Score
16 records- 0192US10347460B2Patterned substrate imaging using multiple electron beamsDONGFANG JINGYUAN ELECTRON LTD·Filed 2018·Granted Jul 9, 2019·10 cites·21 claims
- 0288US10515444B2Care area generation for inspecting integrated circuitsDONGFANG JINGYUAN ELECTRON LTD·Filed 2017·Granted Dec 24, 2019·8 cites·12 claims
- 0387US9746057B2Drive mechanism for OPTO-mechanical inspection systemDONGFANG JINGYUAN ELECTRON LTD·Filed 2015·Granted Aug 29, 2017·12 cites·14 claims
- 0485US10223615B2Learning based defect classificationDONGFANG JINGYUAN ELECTRON LTD·Filed 2016·Granted Mar 5, 2019·6 cites·19 claims
- 0584US10134124B2Reference image contour generationDONGFANG JINGYUAN ELECTRON LTD·Filed 2016·Granted Nov 20, 2018·5 cites·18 claims
- 0675US10628935B2Method and system for identifying defects of integrated circuitsDONGFANG JINGYUAN ELECTRON LTD·Filed 2017·Granted Apr 21, 2020·3 cites·16 claims
- 0773US11023276B2Method and apparatus for data processingDONGFANG JINGYUAN ELECTRON LTD·Filed 2018·Granted Jun 1, 2021·2 cites·19 claims
- 0868US10133838B2Guided defect detection of integrated circuitsDONGFANG JINGYUAN ELECTRON LTD·Filed 2017·Granted Nov 20, 2018·1 cites·20 claims
- 0964US10134560B2Multi-stage/multi-chamber electron-beam inspection systemDONGFANG JINGYUAN ELECTRON LTD·Filed 2016·Granted Nov 20, 2018·1 cites·20 claims
- 1063US11681546B2Method and apparatus for data processingDONGFANG JINGYUAN ELECTRON LTD·Filed 2021·Granted Jun 20, 2023·0 cites·16 claims
- 1151US2023288814A1Method for simulation of negative tone development photolithography process, negative tone development photoresist model, opc model, and electronic deviceDONGFANG JINGYUAN ELECTRON LTD·Filed 2023·Application pending·0 cites
- 1249US10140400B2Method and system for defect prediction of integrated circuitsDONGFANG JINGYUAN ELECTRON LTD·Filed 2017·Granted Nov 27, 2018·0 cites·20 claims
- 1345US9928446B2Augmented automatic defect classificationDONGFANG JINGYUAN ELECTRON LTD·Filed 2016·Granted Mar 27, 2018·0 cites·20 claims
- 1440US2019088442A1Electron-Beam Inspection Systems with optimized throughputDONGFANG JINGYUAN ELECTRON LTD·Filed 2018·Application pending·0 cites
- 1538US10565702B2Dynamic updates for the inspection of integrated circuitsDONGFANG JINGYUAN ELECTRON LTD·Filed 2017·Granted Feb 18, 2020·0 cites·18 claims
- 1630US2016358796A1Cable drive robot mechanism for exchanging samplesDONGFANG JINGYUAN ELECTRON LTD·Filed 2016·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →