Assignee
EGAWA KK
JP·3 granted patents·105 citations·filing 1993–1996
Top patents by PatentIndex Score
3 records- 0178US5401170AMeasuring device and measuring method of implant structureEGAWA KK·Filed 1993·Granted Mar 28, 1995·81 cites·16 claims
- 0255US5555884AMeasuring method by using resonance of a resonance mediumEGAWA KK·Filed 1993·Granted Sep 17, 1996·18 cites·16 claims
- 0332US5706814AMethod of determining a position of a probe relative to a tooth using MRIEGAWA KK·Filed 1996·Granted Jan 13, 1998·6 cites·5 claims
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