Assignee

EILES TRAVIS M

US·1 granted patent·1 pending application·10 citations·filing 2005–2013

Technology mixG01R1 H10W1

Top patents by PatentIndex Score

2 records

0184US9651610B2Visible laser probing for circuit debug and defect analysisEILES TRAVIS M·Filed 2013·Granted May 16, 2017·10 cites·20 claims
0236US2006249859A1Metrology system and method for stacked wafer alignmentEILES TRAVIS M·Filed 2005·Application pending·0 cites

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