Assignee
EL MUL TECHNOLOGIES LTD
IL·8 granted patents·1 pending application·202 citations·filing 1997–2008
Top patents by PatentIndex Score
9 records- 0191US7253418B2Device and method for the examination of samples in a non vacuum environment using a scanning electron microscopeEL MUL TECHNOLOGIES LTD·Filed 2005·Granted Aug 7, 2007·19 cites·20 claims
- 0288US6992300B2Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscopeEL MUL TECHNOLOGIES LTD·Filed 2003·Granted Jan 31, 2006·28 cites·28 claims
- 0387US6512235B1Nanotube-based electron emission device and systems using the sameEL MUL TECHNOLOGIES LTD·Filed 2000·Granted Jan 28, 2003·45 cites·31 claims
- 0486US7417235B2Particle detector for secondary ions and direct and or indirect secondary electronsEL MUL TECHNOLOGIES LTD·Filed 2006·Granted Aug 26, 2008·13 cites·18 claims
- 0584US6989542B2Device and method for the examination of samples in a non vacuum environment using a scanning electron microscopeEL MUL TECHNOLOGIES LTD·Filed 2004·Granted Jan 24, 2006·20 cites·10 claims
- 0681US5990483AParticle detection and particle detector devicesEL MUL TECHNOLOGIES LTD·Filed 1997·Granted Nov 23, 1999·58 cites·19 claims
- 0776US7847268B2Three modes particle detectorEL MUL TECHNOLOGIES LTD·Filed 2008·Granted Dec 7, 2010·5 cites·16 claims
- 0869US7180060B2E×B ion detector for high efficiency time-of-flight mass spectrometersEL MUL TECHNOLOGIES LTD·Filed 2004·Granted Feb 20, 2007·14 cites·16 claims
- 0942US2009309021A1Ion detection method and apparatus with scanning electron beamEL MUL TECHNOLOGIES LTD·Filed 2008·Application pending·0 cites
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