Assignee
ELITE SEMICONDUCTOR INC
TW·11 granted patents·11 citations·filing 2016–2021
Top patents by PatentIndex Score
11 records- 0194US11016035B2Smart defect calibration system and the method thereofELITE SEMICONDUCTOR INC·Filed 2018·Granted May 25, 2021·8 cites·14 claims
- 0275US11774373B2Smart coordinate conversion and calibration system in semiconductor wafer manufacturingELITE SEMICONDUCTOR INC·Filed 2021·Granted Oct 3, 2023·0 cites·11 claims
- 0375US11774372B2Smart coordinate conversion and calibration system in semiconductor wafer manufacturingELITE SEMICONDUCTOR INC·Filed 2021·Granted Oct 3, 2023·0 cites·13 claims
- 0475US11761904B2Smart defect calibration system in semiconductor wafer manufacturingELITE SEMICONDUCTOR INC·Filed 2021·Granted Sep 19, 2023·0 cites·11 claims
- 0575US11719649B2Method for smart conversion and calibration of coordinateELITE SEMICONDUCTOR INC·Filed 2021·Granted Aug 8, 2023·0 cites·8 claims
- 0675US11719650B2Method for performing smart semiconductor wafer defect calibrationELITE SEMICONDUCTOR INC·Filed 2021·Granted Aug 8, 2023·0 cites·10 claims
- 0775US11719648B2Method for smart conversion and calibration of coordinateELITE SEMICONDUCTOR INC·Filed 2021·Granted Aug 8, 2023·0 cites·6 claims
- 0874US10228421B2Method and system for intelligent defect classification and sampling, and non-transitory computer-readable storage deviceELITE SEMICONDUCTOR INC·Filed 2016·Granted Mar 12, 2019·2 cites·12 claims
- 0961US10726192B2Semiconductor Fab's defect operating system and method thereofELITE SEMICONDUCTOR INC·Filed 2019·Granted Jul 28, 2020·1 cites·16 claims
- 1042US10409924B2Intelligent CAA failure pre-diagnosis method and system for design layoutELITE SEMICONDUCTOR INC·Filed 2017·Granted Sep 10, 2019·0 cites·13 claims
- 1141US10719655B2Method and system for quickly diagnosing, classifying, and sampling in-line defects based on CAA pre-diagnosis databaseELITE SEMICONDUCTOR INC·Filed 2018·Granted Jul 21, 2020·0 cites·8 claims
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